JPS6443760A - Automatic analysis apparatus - Google Patents

Automatic analysis apparatus

Info

Publication number
JPS6443760A
JPS6443760A JP20138687A JP20138687A JPS6443760A JP S6443760 A JPS6443760 A JP S6443760A JP 20138687 A JP20138687 A JP 20138687A JP 20138687 A JP20138687 A JP 20138687A JP S6443760 A JPS6443760 A JP S6443760A
Authority
JP
Japan
Prior art keywords
item
analysis
ratio
result
measurement result
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP20138687A
Other languages
Japanese (ja)
Other versions
JP2531190B2 (en
Inventor
Kiyokazu Nakano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP62201386A priority Critical patent/JP2531190B2/en
Publication of JPS6443760A publication Critical patent/JPS6443760A/en
Application granted granted Critical
Publication of JP2531190B2 publication Critical patent/JP2531190B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To enhance the accuracy with microsamples by storing the measurement result of a 1st inspection item, determining the ratio to the previous measurement result from the analysis with the same item as in the previous time after one round and multiplying the measurement result of the 2nd inspection item by said ratio thereby correcting the result. CONSTITUTION:A control circuit 20, a sampling device 7 and an analyzing reagent dispenser 12, etc., are provided to the titled apparatus. The device 7 injects the specified volume of the sample into a reaction tube 4 in accordance with the signal from the circuit 20. The dispenser 12 injects the specified volume of the analyzing reagent corresponding to the inspection item into the tube 4 and detects the absorbancy by a spectroscope 6. The absorbancy is converted to a concn. and is stored. The analysis of the 1st item is executed and the ratio to the stored analysis result of the 1st item of the 1st time is computed if the analysis of the 2nd item is commanded when the measurement of the 1st item with respect to the entire samples has done. The measurement result of the absorbancy of the 2nd item is multiplied by this ratio to correct the error component of the concn. increased upon lapse of time. The exact analysis result is thus obtd. regardless of the concentration of the sample.
JP62201386A 1987-08-11 1987-08-11 Automatic analyzer Expired - Lifetime JP2531190B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62201386A JP2531190B2 (en) 1987-08-11 1987-08-11 Automatic analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62201386A JP2531190B2 (en) 1987-08-11 1987-08-11 Automatic analyzer

Publications (2)

Publication Number Publication Date
JPS6443760A true JPS6443760A (en) 1989-02-16
JP2531190B2 JP2531190B2 (en) 1996-09-04

Family

ID=16440223

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62201386A Expired - Lifetime JP2531190B2 (en) 1987-08-11 1987-08-11 Automatic analyzer

Country Status (1)

Country Link
JP (1) JP2531190B2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57108639A (en) * 1980-12-26 1982-07-06 Olympus Optical Co Ltd Compensating method of data for evaporated part of sample
JPS5987362A (en) * 1982-11-11 1984-05-19 Shimadzu Corp Method of sample analysis
JPS62144072A (en) * 1985-12-19 1987-06-27 Toshiba Corp Automatic chemical analyzer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57108639A (en) * 1980-12-26 1982-07-06 Olympus Optical Co Ltd Compensating method of data for evaporated part of sample
JPS5987362A (en) * 1982-11-11 1984-05-19 Shimadzu Corp Method of sample analysis
JPS62144072A (en) * 1985-12-19 1987-06-27 Toshiba Corp Automatic chemical analyzer

Also Published As

Publication number Publication date
JP2531190B2 (en) 1996-09-04

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