JPS57142549A - Analyzer - Google Patents

Analyzer

Info

Publication number
JPS57142549A
JPS57142549A JP56028542A JP2854281A JPS57142549A JP S57142549 A JPS57142549 A JP S57142549A JP 56028542 A JP56028542 A JP 56028542A JP 2854281 A JP2854281 A JP 2854281A JP S57142549 A JPS57142549 A JP S57142549A
Authority
JP
Japan
Prior art keywords
analyzed
sample
light emitting
conducted
loaded
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56028542A
Other languages
Japanese (ja)
Inventor
Masato Yoshihara
Masakatsu Fujino
Isao Fukui
Naoki Imamura
Takahide Hirano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Nippon Steel Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Sumitomo Metal Industries Ltd
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Sumitomo Metal Industries Ltd, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP56028542A priority Critical patent/JPS57142549A/en
Publication of JPS57142549A publication Critical patent/JPS57142549A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges

Abstract

PURPOSE:To enable automatic selection and setting of the constant of equipment well suited to the kind of sample to be analyzed by performing a computation to correct the constant for the output of the body of an analyzer when a reference sample is analyzed. CONSTITUTION:A sample is sent to the position (a) of picking up samples with a conveyor 91, loaded into a light emitting stand 1a with a sample loading device 3 and analyzed with a light emitting spectroscopic analyzer 1. On the other hand, while a computing unit 2 is operating at a reference mode, a reference sample is taken out from a turn table 41 of a reference sample grinder 4 and loaded into the light emitting stand 1a. This standardization will be made where analysis has been conducted N times or a time T2 has elaspsed. Grinding shall be conducted at an interval of T1 during which the oxidation of the standard sample progresses to a certain extent. The ratio of measuring intensity is memorized in the computating unit 2 for individual elements to be analyzed beforehand and hence, a group having a intensity ratio range including the measuring intensity ratio of the element being analyzed is discriminated to select a group corresponding to the calibration curve.
JP56028542A 1981-02-27 1981-02-27 Analyzer Pending JPS57142549A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56028542A JPS57142549A (en) 1981-02-27 1981-02-27 Analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56028542A JPS57142549A (en) 1981-02-27 1981-02-27 Analyzer

Publications (1)

Publication Number Publication Date
JPS57142549A true JPS57142549A (en) 1982-09-03

Family

ID=12251544

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56028542A Pending JPS57142549A (en) 1981-02-27 1981-02-27 Analyzer

Country Status (1)

Country Link
JP (1) JPS57142549A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63151838A (en) * 1986-12-16 1988-06-24 Shimadzu Corp Emission spectroanalyser
JPH0483160A (en) * 1990-07-26 1992-03-17 Shimadzu Corp Toc meter
JPH04120365U (en) * 1991-04-15 1992-10-28 理学電機工業株式会社 Calibration device for X-ray analysis
JP2014070922A (en) * 2012-09-27 2014-04-21 Jx Nippon Mining & Metals Corp Method for analysing sample using laser ablation icp analysis method
KR20160123992A (en) * 2015-04-16 2016-10-26 헤라우스 일렉트로-나이트 인터내셔날 엔. 브이. Spectrometer calibration method and reference material

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5427493A (en) * 1977-08-03 1979-03-01 Kawasaki Steel Co Instrumental analysis

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5427493A (en) * 1977-08-03 1979-03-01 Kawasaki Steel Co Instrumental analysis

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63151838A (en) * 1986-12-16 1988-06-24 Shimadzu Corp Emission spectroanalyser
JPH0483160A (en) * 1990-07-26 1992-03-17 Shimadzu Corp Toc meter
JPH04120365U (en) * 1991-04-15 1992-10-28 理学電機工業株式会社 Calibration device for X-ray analysis
JP2014070922A (en) * 2012-09-27 2014-04-21 Jx Nippon Mining & Metals Corp Method for analysing sample using laser ablation icp analysis method
KR20160123992A (en) * 2015-04-16 2016-10-26 헤라우스 일렉트로-나이트 인터내셔날 엔. 브이. Spectrometer calibration method and reference material
JP2016206189A (en) * 2015-04-16 2016-12-08 ヘレーウス エレクトロ−ナイト インターナシヨナル エヌ ヴイＨｅｒａｅｕｓ Ｅｌｅｃｔｒｏ−Ｎｉｔｅ Ｉｎｔｅｒｎａｔｉｏｎａｌ Ｎ．Ｖ． Spectrometer calibration method and reference material

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