JPS5752133A - Electron beam exposure apparatus - Google Patents

Electron beam exposure apparatus

Info

Publication number
JPS5752133A
JPS5752133A JP55128288A JP12828880A JPS5752133A JP S5752133 A JPS5752133 A JP S5752133A JP 55128288 A JP55128288 A JP 55128288A JP 12828880 A JP12828880 A JP 12828880A JP S5752133 A JPS5752133 A JP S5752133A
Authority
JP
Japan
Prior art keywords
blur
deflecting electrode
electron beam
reduced
masks
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55128288A
Other languages
English (en)
Japanese (ja)
Other versions
JPS622454B2 (enExample
Inventor
Tadahiro Takigawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP55128288A priority Critical patent/JPS5752133A/ja
Publication of JPS5752133A publication Critical patent/JPS5752133A/ja
Publication of JPS622454B2 publication Critical patent/JPS622454B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/3002—Details
    • H01J37/3007—Electron or ion-optical systems

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
JP55128288A 1980-09-16 1980-09-16 Electron beam exposure apparatus Granted JPS5752133A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55128288A JPS5752133A (en) 1980-09-16 1980-09-16 Electron beam exposure apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55128288A JPS5752133A (en) 1980-09-16 1980-09-16 Electron beam exposure apparatus

Publications (2)

Publication Number Publication Date
JPS5752133A true JPS5752133A (en) 1982-03-27
JPS622454B2 JPS622454B2 (enExample) 1987-01-20

Family

ID=14981105

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55128288A Granted JPS5752133A (en) 1980-09-16 1980-09-16 Electron beam exposure apparatus

Country Status (1)

Country Link
JP (1) JPS5752133A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5762000A (en) * 1980-10-01 1982-04-14 Hitachi Ltd Optical device for shaping charged particle beam

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5357762A (en) * 1976-11-04 1978-05-25 Fujitsu Ltd Diaphragm for electron beam exposure apparatus
JPS5410679A (en) * 1977-06-25 1979-01-26 Rikagaku Kenkyusho Method of and device for projecting charged particle beam

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5357762A (en) * 1976-11-04 1978-05-25 Fujitsu Ltd Diaphragm for electron beam exposure apparatus
JPS5410679A (en) * 1977-06-25 1979-01-26 Rikagaku Kenkyusho Method of and device for projecting charged particle beam

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5762000A (en) * 1980-10-01 1982-04-14 Hitachi Ltd Optical device for shaping charged particle beam

Also Published As

Publication number Publication date
JPS622454B2 (enExample) 1987-01-20

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