JPS5750437A - Forming method for pattern of semiconductor device - Google Patents

Forming method for pattern of semiconductor device

Info

Publication number
JPS5750437A
JPS5750437A JP55125778A JP12577880A JPS5750437A JP S5750437 A JPS5750437 A JP S5750437A JP 55125778 A JP55125778 A JP 55125778A JP 12577880 A JP12577880 A JP 12577880A JP S5750437 A JPS5750437 A JP S5750437A
Authority
JP
Japan
Prior art keywords
etching
low viscosity
pattern
patterning
speed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55125778A
Other languages
Japanese (ja)
Inventor
Ryozo Nakayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP55125778A priority Critical patent/JPS5750437A/en
Publication of JPS5750437A publication Critical patent/JPS5750437A/en
Pending legal-status Critical Current

Links

Classifications

    • H10P50/00

Landscapes

  • Weting (AREA)

Abstract

PURPOSE:To obtain the minute pattern by coating the surface of a patterning material formed on a substrate with a material having low viscosity and etching the materials through an etching means which makes the speed of etching of the patterning material faster than the speed of etching of the material having low viscosity. CONSTITUTION:A predetermined pattern is shaped onto the semiconductor substrate 11 by a mask material 12 such as an oxide film, and the pattern is coated with the patterning material 13, such as polycrystal silicon, Al, etc. The material 14 having low viscosity, viscosity thereof is lowered by adding thinner to a photo- resist, is applied and the surface is flattened, and the mask mateial 12, the patterning material 13 and the material 14 having low viscosity are etched by using the etching means which satisfies Vm<Ve<Vp about each speed of etching Vm, Vp, Ve of respective material 12, 13, 14. If the material 14 having low viscosity and the mask material 12 are removed when etching advances properly, only the desired patterning material 13 remains, and the minute pattern is obtained.
JP55125778A 1980-09-10 1980-09-10 Forming method for pattern of semiconductor device Pending JPS5750437A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55125778A JPS5750437A (en) 1980-09-10 1980-09-10 Forming method for pattern of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55125778A JPS5750437A (en) 1980-09-10 1980-09-10 Forming method for pattern of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5750437A true JPS5750437A (en) 1982-03-24

Family

ID=14918601

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55125778A Pending JPS5750437A (en) 1980-09-10 1980-09-10 Forming method for pattern of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5750437A (en)

Similar Documents

Publication Publication Date Title
JPS5534442A (en) Preparation of semiconductor device
EP0095209A3 (en) Method of forming a resist mask resistant to plasma etching
JPS5750437A (en) Forming method for pattern of semiconductor device
CA2006175A1 (en) Method of forming patterned silicone rubber layer
JPS5591130A (en) Production of semiconductor device
JPS643663A (en) Forming method for fine pattern
JPS57100733A (en) Etching method for semiconductor substrate
JPS6424425A (en) Formation of tapered pattern
JPS56277A (en) Forming method of metal layer pattern
JPS6418223A (en) Manufacture of semiconductor device
JPS52130575A (en) Semiconductor device and its preparation
JPS54107277A (en) Production of semiconductor device
JPS5533035A (en) Forming of resist pattern shaped like inverted truncated pyramid
JPS57118641A (en) Lifting-off method
JPS5799781A (en) Manufacture of semiconductor device
JPS56153736A (en) Manufacture of semiconductor device
JPS5796550A (en) Manufacture of semiconductor device
JPS54124975A (en) Manufacture of semiconductor element
JPS55124233A (en) Manufacturing method of semiconductor device
JPS559448A (en) Method of manufacturing semiconductor device
JPS52127173A (en) Pattern formation method
JPS5645029A (en) Polyimide pattern forming method
JPS54112744A (en) Selectively etching method for insulating layer
JPS55111139A (en) Forming method of thin film for fine pattern
JPS5516467A (en) Method of patterning of insulating inorganic film