JPS5746147A - Measuring device for dew point and frost point - Google Patents

Measuring device for dew point and frost point

Info

Publication number
JPS5746147A
JPS5746147A JP12253280A JP12253280A JPS5746147A JP S5746147 A JPS5746147 A JP S5746147A JP 12253280 A JP12253280 A JP 12253280A JP 12253280 A JP12253280 A JP 12253280A JP S5746147 A JPS5746147 A JP S5746147A
Authority
JP
Japan
Prior art keywords
dew
output
frost
comparator
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12253280A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6341417B2 (enExample
Inventor
Masahiro Otani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Yokogawa Hokushin Electric Corp
Yokogawa Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp, Yokogawa Hokushin Electric Corp, Yokogawa Electric Works Ltd filed Critical Yokogawa Electric Corp
Priority to JP12253280A priority Critical patent/JPS5746147A/ja
Publication of JPS5746147A publication Critical patent/JPS5746147A/ja
Publication of JPS6341417B2 publication Critical patent/JPS6341417B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/56Investigating or analyzing materials by the use of thermal means by investigating moisture content
    • G01N25/66Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP12253280A 1980-09-04 1980-09-04 Measuring device for dew point and frost point Granted JPS5746147A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12253280A JPS5746147A (en) 1980-09-04 1980-09-04 Measuring device for dew point and frost point

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12253280A JPS5746147A (en) 1980-09-04 1980-09-04 Measuring device for dew point and frost point

Publications (2)

Publication Number Publication Date
JPS5746147A true JPS5746147A (en) 1982-03-16
JPS6341417B2 JPS6341417B2 (enExample) 1988-08-17

Family

ID=14838181

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12253280A Granted JPS5746147A (en) 1980-09-04 1980-09-04 Measuring device for dew point and frost point

Country Status (1)

Country Link
JP (1) JPS5746147A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63167243U (enExample) * 1987-04-22 1988-10-31
JP2007292275A (ja) * 2006-03-31 2007-11-08 Synztec Co Ltd マウントブッシュ
WO2009088108A1 (en) * 2007-12-14 2009-07-16 Korea Research Institute Of Standards And Science The measurement method of distinguishing dew and frost point using quartz crystal microbalance dew-point sensor in low temperature
JP2021073458A (ja) * 2016-06-08 2021-05-13 国立研究開発法人物質・材料研究機構 露点測定方法及び露点測定装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53148485A (en) * 1977-05-31 1978-12-25 Yokogawa Hokushin Electric Corp Dew point and frost point detector

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53148485A (en) * 1977-05-31 1978-12-25 Yokogawa Hokushin Electric Corp Dew point and frost point detector

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63167243U (enExample) * 1987-04-22 1988-10-31
JP2007292275A (ja) * 2006-03-31 2007-11-08 Synztec Co Ltd マウントブッシュ
WO2009088108A1 (en) * 2007-12-14 2009-07-16 Korea Research Institute Of Standards And Science The measurement method of distinguishing dew and frost point using quartz crystal microbalance dew-point sensor in low temperature
KR100926461B1 (ko) 2007-12-14 2009-11-13 한국표준과학연구원 수정미소저울 노점센서를 이용한 저온에서의 상점과 이슬점구별 측정 방법
JP2021073458A (ja) * 2016-06-08 2021-05-13 国立研究開発法人物質・材料研究機構 露点測定方法及び露点測定装置
US11454603B2 (en) 2016-06-08 2022-09-27 National Institute For Materials Science Dew point measuring method and dew point measuring device

Also Published As

Publication number Publication date
JPS6341417B2 (enExample) 1988-08-17

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