JPS57211566A - Inspecting circuit for output point of logic sequence circuit - Google Patents

Inspecting circuit for output point of logic sequence circuit

Info

Publication number
JPS57211566A
JPS57211566A JP56098048A JP9804881A JPS57211566A JP S57211566 A JPS57211566 A JP S57211566A JP 56098048 A JP56098048 A JP 56098048A JP 9804881 A JP9804881 A JP 9804881A JP S57211566 A JPS57211566 A JP S57211566A
Authority
JP
Japan
Prior art keywords
transistor
semiconductor
output point
circuit
auxiliary relay
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56098048A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0363026B2 (enrdf_load_stackoverflow
Inventor
Tadashi Miyano
Kiyoshi Kimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Original Assignee
Meidensha Corp
Meidensha Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meidensha Corp, Meidensha Electric Manufacturing Co Ltd filed Critical Meidensha Corp
Priority to JP56098048A priority Critical patent/JPS57211566A/ja
Publication of JPS57211566A publication Critical patent/JPS57211566A/ja
Publication of JPH0363026B2 publication Critical patent/JPH0363026B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
JP56098048A 1981-06-24 1981-06-24 Inspecting circuit for output point of logic sequence circuit Granted JPS57211566A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56098048A JPS57211566A (en) 1981-06-24 1981-06-24 Inspecting circuit for output point of logic sequence circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56098048A JPS57211566A (en) 1981-06-24 1981-06-24 Inspecting circuit for output point of logic sequence circuit

Publications (2)

Publication Number Publication Date
JPS57211566A true JPS57211566A (en) 1982-12-25
JPH0363026B2 JPH0363026B2 (enrdf_load_stackoverflow) 1991-09-27

Family

ID=14209287

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56098048A Granted JPS57211566A (en) 1981-06-24 1981-06-24 Inspecting circuit for output point of logic sequence circuit

Country Status (1)

Country Link
JP (1) JPS57211566A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH0363026B2 (enrdf_load_stackoverflow) 1991-09-27

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