JPS57196124A - Load cell - Google Patents

Load cell

Info

Publication number
JPS57196124A
JPS57196124A JP8060281A JP8060281A JPS57196124A JP S57196124 A JPS57196124 A JP S57196124A JP 8060281 A JP8060281 A JP 8060281A JP 8060281 A JP8060281 A JP 8060281A JP S57196124 A JPS57196124 A JP S57196124A
Authority
JP
Japan
Prior art keywords
metal layer
strain gauge
pattern
temperature compensation
formed directly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8060281A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6225977B2 (ko
Inventor
Shozo Takeno
Koichiro Sakamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Sanyo Electric Co Ltd
Toshiba Corp
Toshiba TEC Corp
Original Assignee
Tokyo Sanyo Electric Co Ltd
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Tokyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Sanyo Electric Co Ltd, Toshiba Corp, Tokyo Shibaura Electric Co Ltd, Tokyo Electric Co Ltd filed Critical Tokyo Sanyo Electric Co Ltd
Priority to JP8060281A priority Critical patent/JPS57196124A/ja
Priority to DE8181109813T priority patent/DE3176209D1/de
Priority to EP81109813A priority patent/EP0053337B1/en
Priority to US06/323,726 priority patent/US4432247A/en
Priority to AU77880/81A priority patent/AU528989B2/en
Priority to DK524881A priority patent/DK161215C/da
Priority to CA000391106A priority patent/CA1176075A/en
Publication of JPS57196124A publication Critical patent/JPS57196124A/ja
Publication of JPS6225977B2 publication Critical patent/JPS6225977B2/ja
Priority to HK988/88A priority patent/HK98888A/xx
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2206—Special supports with preselected places to mount the resistance strain gauges; Mounting of supports
    • G01L1/2243—Special supports with preselected places to mount the resistance strain gauges; Mounting of supports the supports being parallelogram-shaped
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2287—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Force In General (AREA)
JP8060281A 1980-11-29 1981-05-27 Load cell Granted JPS57196124A (en)

Priority Applications (8)

Application Number Priority Date Filing Date Title
JP8060281A JPS57196124A (en) 1981-05-27 1981-05-27 Load cell
DE8181109813T DE3176209D1 (en) 1980-11-29 1981-11-21 Load cell and method of manufacturing the same
EP81109813A EP0053337B1 (en) 1980-11-29 1981-11-21 Load cell and method of manufacturing the same
US06/323,726 US4432247A (en) 1980-11-29 1981-11-23 Load cell having thin film strain gauges
AU77880/81A AU528989B2 (en) 1980-11-29 1981-11-25 Load cell and method of manufacturing
DK524881A DK161215C (da) 1980-11-29 1981-11-26 Belastningscelle og fremgangsmaade til fremstilling heraf
CA000391106A CA1176075A (en) 1980-11-29 1981-11-27 Load cell and method of manufacturing the same
HK988/88A HK98888A (en) 1980-11-29 1988-12-08 Load cell and method of manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8060281A JPS57196124A (en) 1981-05-27 1981-05-27 Load cell

Publications (2)

Publication Number Publication Date
JPS57196124A true JPS57196124A (en) 1982-12-02
JPS6225977B2 JPS6225977B2 (ko) 1987-06-05

Family

ID=13722873

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8060281A Granted JPS57196124A (en) 1980-11-29 1981-05-27 Load cell

Country Status (1)

Country Link
JP (1) JPS57196124A (ko)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59230131A (ja) * 1983-06-13 1984-12-24 Tokyo Electric Co Ltd ロ−ドセル
JPS60179943U (ja) * 1984-05-10 1985-11-29 東芝テック株式会社 ロ−ドセル
JP2016507742A (ja) * 2013-01-03 2016-03-10 ヴィシャイ プレシジョン グループ, インコーポレイテッドVishay Precision Group, Inc. 離散的な電気抵抗トリミング機能をもつ電気抵抗の歪みゲージ
JP2022017531A (ja) * 2017-10-17 2022-01-25 ミネベアミツミ株式会社 ひずみゲージ

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2741951B1 (fr) * 1995-12-04 1998-02-20 Europ Propulsion Pont de wheatstone avec compensation de gradient de temperature entre resistances principales du pont et application a un capteur de pression a jauges extensometriques

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5797420A (en) * 1980-11-26 1982-06-17 Gould Inc Thin film strain gauge having temperature compensation resistance not subjected to pressure deformation

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5797420A (en) * 1980-11-26 1982-06-17 Gould Inc Thin film strain gauge having temperature compensation resistance not subjected to pressure deformation

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59230131A (ja) * 1983-06-13 1984-12-24 Tokyo Electric Co Ltd ロ−ドセル
JPH0565807B2 (ko) * 1983-06-13 1993-09-20 Tokyo Electric Co Ltd
JPS60179943U (ja) * 1984-05-10 1985-11-29 東芝テック株式会社 ロ−ドセル
JP2016507742A (ja) * 2013-01-03 2016-03-10 ヴィシャイ プレシジョン グループ, インコーポレイテッドVishay Precision Group, Inc. 離散的な電気抵抗トリミング機能をもつ電気抵抗の歪みゲージ
JP2022017531A (ja) * 2017-10-17 2022-01-25 ミネベアミツミ株式会社 ひずみゲージ

Also Published As

Publication number Publication date
JPS6225977B2 (ko) 1987-06-05

Similar Documents

Publication Publication Date Title
JPS56118374A (en) Semiconductor strain gauge
JPS57196124A (en) Load cell
EP0063295A3 (en) Method for producing thermistors, thermistors produced by this method as well as thermometers containing such thermistors
JPS53131081A (en) Thermometer
US3186229A (en) Temperature-sensitive device
JPS5775438A (en) Semiconductor element
JPS5451489A (en) Semiconductor pressure converter
JPS5740640A (en) Temperature compensating method in humidity measuring device
SU815479A1 (ru) Способ изготовлени фольговыхТЕНзОРЕзиСТОРОВ HA МЕТАлличЕСКОйОСНОВЕ
ATE28361T1 (de) Temperaturfuehler und verfahren zu dessen abgleich.
JPS5795673A (en) Pressure sensitive semiconductor device
US2913691A (en) Temperature compensated gage
JPS5618704A (en) Device for measuring length of crack at high temperature
SU1726980A1 (ru) Полупроводниковый тензорезистор
JPS5730922A (en) Sensor for pressure difference and pressure
SU574602A1 (ru) Термостатиреванный тензорезистор
JPS5618705A (en) Strain gauge element for large strain
SU453631A1 (ru) Способ контроля отверждения огнеупорного покрытия
WALTON Apparatus for Automatically Recording Strains Between Enamel and Metal
DE3277153D1 (en) Process and device for manufacturing semi-conducteur elements with definite physical parameters
SU678420A1 (ru) Способ термоанемометрических измерений
JPS5432282A (en) Semiconductor pressre conversion unit
SU607117A1 (ru) Датчик температуры
SU928426A1 (ru) Способ изготовлени фольговых тензорезисторов
GB1130274A (en) Improvements in or relating to strain sensitive bridges and the fabrication thereof