JPS5618704A - Device for measuring length of crack at high temperature - Google Patents

Device for measuring length of crack at high temperature

Info

Publication number
JPS5618704A
JPS5618704A JP9316279A JP9316279A JPS5618704A JP S5618704 A JPS5618704 A JP S5618704A JP 9316279 A JP9316279 A JP 9316279A JP 9316279 A JP9316279 A JP 9316279A JP S5618704 A JPS5618704 A JP S5618704A
Authority
JP
Japan
Prior art keywords
crack
test piece
piece
change
resistance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9316279A
Other languages
Japanese (ja)
Other versions
JPS5946323B2 (en
Inventor
Teruhiko Tanaka
Hiroshi Uno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Saginomiya Seisakusho Inc
Original Assignee
Saginomiya Seisakusho Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Saginomiya Seisakusho Inc filed Critical Saginomiya Seisakusho Inc
Priority to JP9316279A priority Critical patent/JPS5946323B2/en
Publication of JPS5618704A publication Critical patent/JPS5618704A/en
Publication of JPS5946323B2 publication Critical patent/JPS5946323B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

PURPOSE: To avoid the influence of temperature and accurately measure the length of a crack, by using a dummy piece and utilizing the change in the resistance of the dummy piece to cancel the change in the resistance of a test piece due to the temperature.
CONSTITUTION: A test piece A and a dummy piece B are connected in series with a DC constant-current supply C and placed in a high-temperature furnace 1. The voltage drops picked out from the points a1, a2, b1, b2 of the pieces A, B are applied to amplifiers D, E. A subtracted voltage value VR is displayed on an indicator F. The pieces A, B have the same shape and are made of the same material. Load is applied to the test piece A but no load is applied to the dummy piece B. According to this constitution, the change in the resistance of the test piece A due to temperature is cancelled by that of the dummy piece B and only the change in the resistance corresponding to the length of a crack due to the load applied to the test piece is displayed on the indicator F. Therefore, the length of the crack in the test piece A can be calculated if the relationship between the length of the crack and the change in the resistance is previously calibrated.
COPYRIGHT: (C)1981,JPO&Japio
JP9316279A 1979-07-24 1979-07-24 Crack length measuring device in high temperature environment Expired JPS5946323B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9316279A JPS5946323B2 (en) 1979-07-24 1979-07-24 Crack length measuring device in high temperature environment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9316279A JPS5946323B2 (en) 1979-07-24 1979-07-24 Crack length measuring device in high temperature environment

Publications (2)

Publication Number Publication Date
JPS5618704A true JPS5618704A (en) 1981-02-21
JPS5946323B2 JPS5946323B2 (en) 1984-11-12

Family

ID=14074860

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9316279A Expired JPS5946323B2 (en) 1979-07-24 1979-07-24 Crack length measuring device in high temperature environment

Country Status (1)

Country Link
JP (1) JPS5946323B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63144204A (en) * 1986-12-08 1988-06-16 Babcock Hitachi Kk Strain detecting method for metallic material
JPH06341942A (en) * 1993-06-01 1994-12-13 Nec Corp Measuring method for adhesion of thin film and device therefor

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61135318U (en) * 1985-02-13 1986-08-23
JP3000594U (en) * 1994-01-31 1994-08-09 福井めがね工業株式会社 Eye mirror

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63144204A (en) * 1986-12-08 1988-06-16 Babcock Hitachi Kk Strain detecting method for metallic material
JPH06341942A (en) * 1993-06-01 1994-12-13 Nec Corp Measuring method for adhesion of thin film and device therefor

Also Published As

Publication number Publication date
JPS5946323B2 (en) 1984-11-12

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