JPS57185438A - Production of x-ray exposure mask - Google Patents

Production of x-ray exposure mask

Info

Publication number
JPS57185438A
JPS57185438A JP7046281A JP7046281A JPS57185438A JP S57185438 A JPS57185438 A JP S57185438A JP 7046281 A JP7046281 A JP 7046281A JP 7046281 A JP7046281 A JP 7046281A JP S57185438 A JPS57185438 A JP S57185438A
Authority
JP
Japan
Prior art keywords
film
mask
thin film
electroplating
aperture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7046281A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0160935B2 (enrdf_load_stackoverflow
Inventor
Masaki Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP7046281A priority Critical patent/JPS57185438A/ja
Publication of JPS57185438A publication Critical patent/JPS57185438A/ja
Publication of JPH0160935B2 publication Critical patent/JPH0160935B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/22Masks or mask blanks for imaging by radiation of 100nm or shorter wavelength, e.g. X-ray masks, extreme ultraviolet [EUV] masks; Preparation thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Drying Of Semiconductors (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP7046281A 1981-05-11 1981-05-11 Production of x-ray exposure mask Granted JPS57185438A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7046281A JPS57185438A (en) 1981-05-11 1981-05-11 Production of x-ray exposure mask

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7046281A JPS57185438A (en) 1981-05-11 1981-05-11 Production of x-ray exposure mask

Publications (2)

Publication Number Publication Date
JPS57185438A true JPS57185438A (en) 1982-11-15
JPH0160935B2 JPH0160935B2 (enrdf_load_stackoverflow) 1989-12-26

Family

ID=13432203

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7046281A Granted JPS57185438A (en) 1981-05-11 1981-05-11 Production of x-ray exposure mask

Country Status (1)

Country Link
JP (1) JPS57185438A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008000812A (ja) * 2006-06-26 2008-01-10 Denso Corp 熱交換器用コルゲートフィンの成形方法、およびコルゲートフィン成形用ローラ

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008000812A (ja) * 2006-06-26 2008-01-10 Denso Corp 熱交換器用コルゲートフィンの成形方法、およびコルゲートフィン成形用ローラ

Also Published As

Publication number Publication date
JPH0160935B2 (enrdf_load_stackoverflow) 1989-12-26

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