JPS57180120A - Monitoring device for beam annealing - Google Patents
Monitoring device for beam annealingInfo
- Publication number
- JPS57180120A JPS57180120A JP6578381A JP6578381A JPS57180120A JP S57180120 A JPS57180120 A JP S57180120A JP 6578381 A JP6578381 A JP 6578381A JP 6578381 A JP6578381 A JP 6578381A JP S57180120 A JPS57180120 A JP S57180120A
- Authority
- JP
- Japan
- Prior art keywords
- acoustic wave
- wafer
- laser beam
- transducer
- constitution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000137 annealing Methods 0.000 title 1
- 238000012806 monitoring device Methods 0.000 title 1
- 238000007669 thermal treatment Methods 0.000 abstract 2
- 238000001514 detection method Methods 0.000 abstract 1
- 238000002844 melting Methods 0.000 abstract 1
- 230000008018 melting Effects 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Toxicology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6578381A JPS57180120A (en) | 1981-04-30 | 1981-04-30 | Monitoring device for beam annealing |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6578381A JPS57180120A (en) | 1981-04-30 | 1981-04-30 | Monitoring device for beam annealing |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57180120A true JPS57180120A (en) | 1982-11-06 |
JPH0347730B2 JPH0347730B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1991-07-22 |
Family
ID=13296973
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6578381A Granted JPS57180120A (en) | 1981-04-30 | 1981-04-30 | Monitoring device for beam annealing |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57180120A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6210996B1 (en) | 1995-01-13 | 2001-04-03 | Semiconductor Energy Laboratory Co., Ltd. | Laser illumination system |
JP2009158822A (ja) * | 2007-12-27 | 2009-07-16 | Semiconductor Energy Lab Co Ltd | 半導体層の評価方法及び半導体基板の作製方法 |
US7714251B2 (en) | 2005-11-23 | 2010-05-11 | Semiconductor Energy Laboratory Co., Ltd | Laser irradiation apparatus |
JP2016149573A (ja) * | 2007-11-08 | 2016-08-18 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | パルス列アニーリング方法および装置 |
US11040415B2 (en) | 2007-11-08 | 2021-06-22 | Applied Materials, Inc. | Pulse train annealing method and apparatus |
-
1981
- 1981-04-30 JP JP6578381A patent/JPS57180120A/ja active Granted
Non-Patent Citations (1)
Title |
---|
APPLIED PHYSICS LITTERS=1980 * |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6210996B1 (en) | 1995-01-13 | 2001-04-03 | Semiconductor Energy Laboratory Co., Ltd. | Laser illumination system |
US6468842B2 (en) | 1995-01-13 | 2002-10-22 | Semiconductor Energy Laboratory Co., Ltd. | Laser illumination system |
US6706570B2 (en) | 1995-01-13 | 2004-03-16 | Semiconductor Energy Laboratory Co., Ltd., | Laser illumination system |
US7528079B2 (en) | 1995-01-13 | 2009-05-05 | Semiconductor Energy Laboratory Co., Ltd. | Method of changing an energy attenuation factor of a linear light in order to crystallize a semiconductor film |
US7714251B2 (en) | 2005-11-23 | 2010-05-11 | Semiconductor Energy Laboratory Co., Ltd | Laser irradiation apparatus |
JP2016149573A (ja) * | 2007-11-08 | 2016-08-18 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | パルス列アニーリング方法および装置 |
US11040415B2 (en) | 2007-11-08 | 2021-06-22 | Applied Materials, Inc. | Pulse train annealing method and apparatus |
US12186832B2 (en) | 2007-11-08 | 2025-01-07 | Applied Materials, Inc. | Pulse train annealing method and apparatus |
JP2009158822A (ja) * | 2007-12-27 | 2009-07-16 | Semiconductor Energy Lab Co Ltd | 半導体層の評価方法及び半導体基板の作製方法 |
Also Published As
Publication number | Publication date |
---|---|
JPH0347730B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1991-07-22 |
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