JPS5717871A - Environment test device - Google Patents

Environment test device

Info

Publication number
JPS5717871A
JPS5717871A JP9242680A JP9242680A JPS5717871A JP S5717871 A JPS5717871 A JP S5717871A JP 9242680 A JP9242680 A JP 9242680A JP 9242680 A JP9242680 A JP 9242680A JP S5717871 A JPS5717871 A JP S5717871A
Authority
JP
Japan
Prior art keywords
guide rail
contact
stopper bar
bar
worked
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9242680A
Other languages
Japanese (ja)
Inventor
Katsuji Kawaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP9242680A priority Critical patent/JPS5717871A/en
Publication of JPS5717871A publication Critical patent/JPS5717871A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To effectively implement heating and cooling of an element by providing a heating element or a heat absorber to both the lower guide rail and the upper guide rail and moving one of them to press contact it against the semiconductor element. CONSTITUTION:When a stopper bar 6 is made to go up while a stopper bar 5 and a partition bar 7 are made to go down, only the element 1 at the far end is transferred and stopped at the stopper bar 5. Then an arm 10 is worked and the contact piece of a contact 9 is made to contact with the external lead wire of the element 1 and electric characteristics are measured. During this measuring period, the upper guide rail 23 built-in with a heating element 19 and a temerature detector 20 is made to go down along a fulcrum 24 and the element 1 is pressed against the lower guide rail to heat it. When the measurement is terminated, the arm 10 is worked to detach the contact piece 8, the stopper bar is made to go up and the elment 1 is discharged in a sorting box corresponding to the measured result. Thus, waste of the heat source is eliminated and the device can be arranged in a compact size and is simple.
JP9242680A 1980-07-04 1980-07-04 Environment test device Pending JPS5717871A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9242680A JPS5717871A (en) 1980-07-04 1980-07-04 Environment test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9242680A JPS5717871A (en) 1980-07-04 1980-07-04 Environment test device

Publications (1)

Publication Number Publication Date
JPS5717871A true JPS5717871A (en) 1982-01-29

Family

ID=14054097

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9242680A Pending JPS5717871A (en) 1980-07-04 1980-07-04 Environment test device

Country Status (1)

Country Link
JP (1) JPS5717871A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59124374U (en) * 1983-02-09 1984-08-21 日立電子エンジニアリング株式会社 IC handler heat block drive device
JPS61161463A (en) * 1985-01-11 1986-07-22 Hitachi Electronics Eng Co Ltd Shutter device of thermostatic oven for ic handler
JPS6252158A (en) * 1985-09-02 1987-03-06 三菱油化株式会社 Hydraulic cement composition and manufacture of cement moldings
US4691831A (en) * 1984-06-25 1987-09-08 Takeda Riken Co., Ltd. IC test equipment
JPS6323666U (en) * 1986-07-30 1988-02-16
JPH01163570A (en) * 1987-12-17 1989-06-27 Kobe Steel Ltd Low-temperature test apparatus for ic device
JPH0197189U (en) * 1987-12-17 1989-06-28
JPH0933609A (en) * 1995-07-24 1997-02-07 Seiwa Sangyo Kk Automatic sorting apparatus for chip-shaped electronic component

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59124374U (en) * 1983-02-09 1984-08-21 日立電子エンジニアリング株式会社 IC handler heat block drive device
JPH0119104Y2 (en) * 1983-02-09 1989-06-02
US4691831A (en) * 1984-06-25 1987-09-08 Takeda Riken Co., Ltd. IC test equipment
JPS61161463A (en) * 1985-01-11 1986-07-22 Hitachi Electronics Eng Co Ltd Shutter device of thermostatic oven for ic handler
JPS6252158A (en) * 1985-09-02 1987-03-06 三菱油化株式会社 Hydraulic cement composition and manufacture of cement moldings
JPS6323666U (en) * 1986-07-30 1988-02-16
JPH01163570A (en) * 1987-12-17 1989-06-27 Kobe Steel Ltd Low-temperature test apparatus for ic device
JPH0197189U (en) * 1987-12-17 1989-06-28
JPH0933609A (en) * 1995-07-24 1997-02-07 Seiwa Sangyo Kk Automatic sorting apparatus for chip-shaped electronic component

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