JPS57164500A - Testing device of semiconductor memory - Google Patents

Testing device of semiconductor memory

Info

Publication number
JPS57164500A
JPS57164500A JP56049757A JP4975781A JPS57164500A JP S57164500 A JPS57164500 A JP S57164500A JP 56049757 A JP56049757 A JP 56049757A JP 4975781 A JP4975781 A JP 4975781A JP S57164500 A JPS57164500 A JP S57164500A
Authority
JP
Japan
Prior art keywords
memory
bits
defective
information
defective bits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56049757A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6321999B2 (enrdf_load_stackoverflow
Inventor
Yasuo Eguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP56049757A priority Critical patent/JPS57164500A/ja
Publication of JPS57164500A publication Critical patent/JPS57164500A/ja
Publication of JPS6321999B2 publication Critical patent/JPS6321999B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP56049757A 1981-04-02 1981-04-02 Testing device of semiconductor memory Granted JPS57164500A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56049757A JPS57164500A (en) 1981-04-02 1981-04-02 Testing device of semiconductor memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56049757A JPS57164500A (en) 1981-04-02 1981-04-02 Testing device of semiconductor memory

Publications (2)

Publication Number Publication Date
JPS57164500A true JPS57164500A (en) 1982-10-09
JPS6321999B2 JPS6321999B2 (enrdf_load_stackoverflow) 1988-05-10

Family

ID=12840054

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56049757A Granted JPS57164500A (en) 1981-04-02 1981-04-02 Testing device of semiconductor memory

Country Status (1)

Country Link
JP (1) JPS57164500A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5317573A (en) * 1989-08-30 1994-05-31 International Business Machines Corporation Apparatus and method for real time data error capture and compression redundancy analysis

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0498093U (enrdf_load_stackoverflow) * 1991-01-17 1992-08-25

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5066124A (enrdf_load_stackoverflow) * 1973-10-12 1975-06-04
JPS5354428A (en) * 1976-10-27 1978-05-17 Nec Corp Inspection method of semiconductor memory divice
JPS5384634A (en) * 1976-12-30 1978-07-26 Fujitsu Ltd Ic memory unit device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5066124A (enrdf_load_stackoverflow) * 1973-10-12 1975-06-04
JPS5354428A (en) * 1976-10-27 1978-05-17 Nec Corp Inspection method of semiconductor memory divice
JPS5384634A (en) * 1976-12-30 1978-07-26 Fujitsu Ltd Ic memory unit device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5317573A (en) * 1989-08-30 1994-05-31 International Business Machines Corporation Apparatus and method for real time data error capture and compression redundancy analysis

Also Published As

Publication number Publication date
JPS6321999B2 (enrdf_load_stackoverflow) 1988-05-10

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