JPS5715297A - Memory element - Google Patents

Memory element

Info

Publication number
JPS5715297A
JPS5715297A JP8922980A JP8922980A JPS5715297A JP S5715297 A JPS5715297 A JP S5715297A JP 8922980 A JP8922980 A JP 8922980A JP 8922980 A JP8922980 A JP 8922980A JP S5715297 A JPS5715297 A JP S5715297A
Authority
JP
Japan
Prior art keywords
data
address
gate
storing
signal generating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8922980A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6331880B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Toshihiro Okabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8922980A priority Critical patent/JPS5715297A/ja
Publication of JPS5715297A publication Critical patent/JPS5715297A/ja
Publication of JPS6331880B2 publication Critical patent/JPS6331880B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP8922980A 1980-07-02 1980-07-02 Memory element Granted JPS5715297A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8922980A JPS5715297A (en) 1980-07-02 1980-07-02 Memory element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8922980A JPS5715297A (en) 1980-07-02 1980-07-02 Memory element

Publications (2)

Publication Number Publication Date
JPS5715297A true JPS5715297A (en) 1982-01-26
JPS6331880B2 JPS6331880B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-06-27

Family

ID=13964908

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8922980A Granted JPS5715297A (en) 1980-07-02 1980-07-02 Memory element

Country Status (1)

Country Link
JP (1) JPS5715297A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62119366A (ja) * 1985-11-18 1987-05-30 ダイキン工業株式会社 冷凍装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62119366A (ja) * 1985-11-18 1987-05-30 ダイキン工業株式会社 冷凍装置

Also Published As

Publication number Publication date
JPS6331880B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-06-27

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