JPS5712496A - Integrated circuit device for memory - Google Patents

Integrated circuit device for memory

Info

Publication number
JPS5712496A
JPS5712496A JP8536180A JP8536180A JPS5712496A JP S5712496 A JPS5712496 A JP S5712496A JP 8536180 A JP8536180 A JP 8536180A JP 8536180 A JP8536180 A JP 8536180A JP S5712496 A JPS5712496 A JP S5712496A
Authority
JP
Japan
Prior art keywords
address
memory
circuit
data
read data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8536180A
Other languages
Japanese (ja)
Inventor
Hidehiko Kobayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP8536180A priority Critical patent/JPS5712496A/en
Publication of JPS5712496A publication Critical patent/JPS5712496A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE:To realize an individual and high-speed test for an IC for memory, by providing an address generating circuit plus a circuit that compares the read data with an expected data into a memory IC. CONSTITUTION:When a test address signal 404 and an address control signal 400 are applied to an address decoding circuit 3 from a control circuit 1, one of address decoding signals 300-30mO is delivered to select one of memory cell groups iO-in(i=0,1-n). In the case of a writing action, an address signal 102 is delivered to write data 210-21n to be written into the cell groups iO-in. In the case of a reading action, read data 200-20n read out of the groups iO-in plus the signal 102, i.e., an expected value are supplied to a comparator 6. Then the result of coincidence or dissidence is supplied to a data buffer circuit 5 to be delivered by a read data control signal 401 and in the form of a read data 101.
JP8536180A 1980-06-24 1980-06-24 Integrated circuit device for memory Pending JPS5712496A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8536180A JPS5712496A (en) 1980-06-24 1980-06-24 Integrated circuit device for memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8536180A JPS5712496A (en) 1980-06-24 1980-06-24 Integrated circuit device for memory

Publications (1)

Publication Number Publication Date
JPS5712496A true JPS5712496A (en) 1982-01-22

Family

ID=13856564

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8536180A Pending JPS5712496A (en) 1980-06-24 1980-06-24 Integrated circuit device for memory

Country Status (1)

Country Link
JP (1) JPS5712496A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62298086A (en) * 1986-05-07 1987-12-25 アドバンスト・マイクロ・ディバイシズ・インコ−ポレ−テッド Integrated electronic memory circuit and electronic memory access system
JPS6366799A (en) * 1986-09-08 1988-03-25 Toshiba Corp Semiconductor memory device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62298086A (en) * 1986-05-07 1987-12-25 アドバンスト・マイクロ・ディバイシズ・インコ−ポレ−テッド Integrated electronic memory circuit and electronic memory access system
JPS6366799A (en) * 1986-09-08 1988-03-25 Toshiba Corp Semiconductor memory device

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