JPS57145311A - Heat treatment for compound semiconductor wafer - Google Patents

Heat treatment for compound semiconductor wafer

Info

Publication number
JPS57145311A
JPS57145311A JP3032381A JP3032381A JPS57145311A JP S57145311 A JPS57145311 A JP S57145311A JP 3032381 A JP3032381 A JP 3032381A JP 3032381 A JP3032381 A JP 3032381A JP S57145311 A JPS57145311 A JP S57145311A
Authority
JP
Japan
Prior art keywords
heat treatment
compound semiconductor
misfit
contaminated
quality
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3032381A
Other languages
Japanese (ja)
Inventor
Hisatsune Watanabe
Itsuo Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP3032381A priority Critical patent/JPS57145311A/en
Publication of JPS57145311A publication Critical patent/JPS57145311A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/324Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
    • H01L21/3245Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering of AIIIBV compounds

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Semiconductor Lasers (AREA)
  • Led Devices (AREA)

Abstract

PURPOSE:To improve the quality of a compound semiconductor crystal which is contaminated by a heavy metal by covering III-V group semiconductor compound wafer with a thermal decomposition controlling protection film in a condition having a misfit transposition based on grating constant difference. CONSTITUTION:As an example, a three-dimensional mixed crystal of Ga Aso9Po is formed at 1.2mu by a vapor growth processing on the surface of GaAs epitaxial wafer for infrared ray luminous diode use and a misfit transposition is introduced. The surface of the GaAso9Po layer is covered with Si3N4 film of 0.1mu and a heat treatment is provided for the surface at 850 deg.C for 5hr in an argon atmosphere. The light emitting effect due to the heat treatment as described above can be improved remarkably and the quality of the compound semiconductor crystal contaminated also be improved remarkably.
JP3032381A 1981-03-03 1981-03-03 Heat treatment for compound semiconductor wafer Pending JPS57145311A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3032381A JPS57145311A (en) 1981-03-03 1981-03-03 Heat treatment for compound semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3032381A JPS57145311A (en) 1981-03-03 1981-03-03 Heat treatment for compound semiconductor wafer

Publications (1)

Publication Number Publication Date
JPS57145311A true JPS57145311A (en) 1982-09-08

Family

ID=12300589

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3032381A Pending JPS57145311A (en) 1981-03-03 1981-03-03 Heat treatment for compound semiconductor wafer

Country Status (1)

Country Link
JP (1) JPS57145311A (en)

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