JPS57135495A - Mnos storage element - Google Patents
Mnos storage elementInfo
- Publication number
- JPS57135495A JPS57135495A JP1989081A JP1989081A JPS57135495A JP S57135495 A JPS57135495 A JP S57135495A JP 1989081 A JP1989081 A JP 1989081A JP 1989081 A JP1989081 A JP 1989081A JP S57135495 A JPS57135495 A JP S57135495A
- Authority
- JP
- Japan
- Prior art keywords
- mnos
- storage element
- substrate
- storage
- holding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0466—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS]
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
Abstract
PURPOSE:To extend the storage holding time of an MNOS storage element by biasing the gate terminals of the MNOS transistor to higher potentials than that of a substrate without turning on the MNOS transistor during data holding other than writing and reading. CONSTITUTION:While electrons are trapped in the trap center of a P channel MNOS storage element, gate terminals 5 and 5' are biased to a higher potential than that of a silicon substrate so that those terminals turn off during data holding. In said state, the threshold voltage is in a depletion area. When a gate voltage to the substrate is varied by three stages (VGB=+1.5V, 0V and -1.5V as shown in Fig. (a)), it is evident that when VGB=1.5V, a secular change in ''0'' Level threshold value is extremely small and the capability of storage and holding is superior.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989081A JPS57135495A (en) | 1981-02-13 | 1981-02-13 | Mnos storage element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989081A JPS57135495A (en) | 1981-02-13 | 1981-02-13 | Mnos storage element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57135495A true JPS57135495A (en) | 1982-08-21 |
Family
ID=12011784
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1989081A Pending JPS57135495A (en) | 1981-02-13 | 1981-02-13 | Mnos storage element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57135495A (en) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS502480A (en) * | 1973-05-08 | 1975-01-11 | ||
JPS5066125A (en) * | 1973-10-11 | 1975-06-04 | ||
JPS5279840A (en) * | 1975-12-26 | 1977-07-05 | Nec Corp | Operation of nonvolatile semiconductor memory element |
JPS5330310A (en) * | 1976-09-01 | 1978-03-22 | Fujitsu Ltd | Magnetic head assembly of floating type |
-
1981
- 1981-02-13 JP JP1989081A patent/JPS57135495A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS502480A (en) * | 1973-05-08 | 1975-01-11 | ||
JPS5066125A (en) * | 1973-10-11 | 1975-06-04 | ||
JPS5279840A (en) * | 1975-12-26 | 1977-07-05 | Nec Corp | Operation of nonvolatile semiconductor memory element |
JPS5330310A (en) * | 1976-09-01 | 1978-03-22 | Fujitsu Ltd | Magnetic head assembly of floating type |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4419744A (en) | Non-volatile static ram element | |
JPS649663A (en) | Electrically erasable programmable read-only memory | |
JPS5333076A (en) | Production of mos type integrated circuit | |
JPS59123320A (en) | Timer circuit | |
JPS6240697A (en) | Semiconductor memory device | |
JPS5538624A (en) | Nonvolatile semiconductor memory device | |
JPS5372429A (en) | Non-volatile semiconductor memory unit | |
JPS57135495A (en) | Mnos storage element | |
GB1401487A (en) | Storage circuit using multiple condition semiconductor storage elements | |
JPS5577088A (en) | Nonvolatile semiconductor memory unit | |
KR980006399A (en) | Erasing Method of Nonvolatile Semiconductor Memory Device | |
JPS5228277A (en) | Non-voltatile semiconductor memory device | |
KR900008409B1 (en) | Timer circuit | |
JPS56129374A (en) | Writing and cancelling methods of fixed memory | |
KR910020897A (en) | Nonvolatile Semiconductor Memory | |
JPS5469037A (en) | Data erasing method for nonvolatile semiconductor memory element | |
JPS5593591A (en) | Driving system of semiconductor memory device | |
JPS57103368A (en) | Variable-capacitance device | |
JPS57189391A (en) | Nonvolatile semiconductor memory integrated circuit | |
JPS6145317B2 (en) | ||
SU491155A1 (en) | Memory element | |
JPS644077A (en) | Memory cell | |
JPS6413772A (en) | Method of reading semiconductor non-volatile memory | |
JPS5792489A (en) | Semiconductor storage device | |
JPS6233392A (en) | Semiconductor non-volatile memory device |