JPS57134938A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS57134938A JPS57134938A JP56021155A JP2115581A JPS57134938A JP S57134938 A JPS57134938 A JP S57134938A JP 56021155 A JP56021155 A JP 56021155A JP 2115581 A JP2115581 A JP 2115581A JP S57134938 A JPS57134938 A JP S57134938A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- groove
- shallower
- etching
- semiconductor substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Formation Of Insulating Films (AREA)
Abstract
PURPOSE:To raise a breakdown voltage and decrease a leak current by providing the second groove that is shallower than the first and the second layers and extending from the first layer to the first groove. CONSTITUTION:In manufacture of such as a diode, the first layer 2 and the second layer 3 of a p type diffusion layer are formed at distance at the same time on an n type semiconductor substrate 1. The second groove 6 is made by etching with its end reaching the first layer 2 and wider than the first groove 4 and shallower than the second layer 3. A glass layer 5 is deposited on the first groove 4 and the second groove 6. Defects on the main surface of the semiconductor substrate are removed by etching, raising the breakdown voltage and at the same time decreasing a leak current.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56021155A JPS57134938A (en) | 1981-02-13 | 1981-02-13 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56021155A JPS57134938A (en) | 1981-02-13 | 1981-02-13 | Semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57134938A true JPS57134938A (en) | 1982-08-20 |
Family
ID=12047009
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56021155A Pending JPS57134938A (en) | 1981-02-13 | 1981-02-13 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57134938A (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50106565A (en) * | 1974-01-11 | 1975-08-22 | ||
JPS5516474A (en) * | 1978-07-21 | 1980-02-05 | Nec Corp | Method of manufacturing semiconductor element |
-
1981
- 1981-02-13 JP JP56021155A patent/JPS57134938A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS50106565A (en) * | 1974-01-11 | 1975-08-22 | ||
JPS5516474A (en) * | 1978-07-21 | 1980-02-05 | Nec Corp | Method of manufacturing semiconductor element |
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