JPS57133659A - Manufacture of polycrystalline semiconductor element - Google Patents

Manufacture of polycrystalline semiconductor element

Info

Publication number
JPS57133659A
JPS57133659A JP1878481A JP1878481A JPS57133659A JP S57133659 A JPS57133659 A JP S57133659A JP 1878481 A JP1878481 A JP 1878481A JP 1878481 A JP1878481 A JP 1878481A JP S57133659 A JPS57133659 A JP S57133659A
Authority
JP
Japan
Prior art keywords
layer
poly
doped
impurity
type impurity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1878481A
Other languages
Japanese (ja)
Inventor
Haruhide Fuse
Koichi Kugimiya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP1878481A priority Critical patent/JPS57133659A/en
Publication of JPS57133659A publication Critical patent/JPS57133659A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To manufacture a poly Si resistor having excellent temperature characteristics and resistance value controllability by introducing P type and N type impurities to a poly Si layer at predetermined concentration or higher, introducing a desired impurity and forming a prescribed resistance layer. CONSTITUTION:A poly Si layer 3 is deposited and shaped onto an insulating film 2 (such as a SiO2 film) molded to a Si substrate 1. The P type impurity such as B and the N type impurity such as As are doped to the poly Si layer 3, the surface is thermally treated as necessary, and a diffusion layer 5 is formed to the whole layer. The impurities are doped so that the P type impurity is doped by 10<18>cm<-3> or more and the N type impurity by 3X10<18>cm<-3> or more, the grain boundary of the poly Si 3 is buried, carriers are compensated and high resistance is obtained. A fixed quantity of the impurity 6, such as B, As, P are injected, the surface is thermally treated, and a doped layer 7 having the desired resistance value is shaped. Accordingly, low resistance value can be controlled approximately rectilinearly at the concentration of doping at the succeeding stage, and the poly Si resistor having a small resistance temperature coefficient can be manufactured.
JP1878481A 1981-02-10 1981-02-10 Manufacture of polycrystalline semiconductor element Pending JPS57133659A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1878481A JPS57133659A (en) 1981-02-10 1981-02-10 Manufacture of polycrystalline semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1878481A JPS57133659A (en) 1981-02-10 1981-02-10 Manufacture of polycrystalline semiconductor element

Publications (1)

Publication Number Publication Date
JPS57133659A true JPS57133659A (en) 1982-08-18

Family

ID=11981239

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1878481A Pending JPS57133659A (en) 1981-02-10 1981-02-10 Manufacture of polycrystalline semiconductor element

Country Status (1)

Country Link
JP (1) JPS57133659A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60109260A (en) * 1983-11-15 1985-06-14 インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション Compensated polycrystalline silicon resistance element
JPH02303154A (en) * 1989-05-18 1990-12-17 Fujitsu Ltd Manufacture of semiconductor device
JPH0582465A (en) * 1991-09-24 1993-04-02 Victor Co Of Japan Ltd Semiconductor device and mos fet

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60109260A (en) * 1983-11-15 1985-06-14 インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション Compensated polycrystalline silicon resistance element
JPH02303154A (en) * 1989-05-18 1990-12-17 Fujitsu Ltd Manufacture of semiconductor device
JPH0582465A (en) * 1991-09-24 1993-04-02 Victor Co Of Japan Ltd Semiconductor device and mos fet

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