JPS57120936A - Step and repeat camera device - Google Patents
Step and repeat camera deviceInfo
- Publication number
- JPS57120936A JPS57120936A JP636981A JP636981A JPS57120936A JP S57120936 A JPS57120936 A JP S57120936A JP 636981 A JP636981 A JP 636981A JP 636981 A JP636981 A JP 636981A JP S57120936 A JPS57120936 A JP S57120936A
- Authority
- JP
- Japan
- Prior art keywords
- foreign matter
- reticle
- machine
- inspecting
- laser beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000015572 biosynthetic process Effects 0.000 abstract 1
- 230000002950 deficient Effects 0.000 abstract 1
- 230000001678 irradiating effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70866—Environment aspects, e.g. pressure of beam-path gas, temperature of mask or workpiece
Landscapes
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Toxicology (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Warehouses Or Storage Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP636981A JPS57120936A (en) | 1981-01-21 | 1981-01-21 | Step and repeat camera device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP636981A JPS57120936A (en) | 1981-01-21 | 1981-01-21 | Step and repeat camera device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57120936A true JPS57120936A (en) | 1982-07-28 |
| JPS6323539B2 JPS6323539B2 (enExample) | 1988-05-17 |
Family
ID=11636447
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP636981A Granted JPS57120936A (en) | 1981-01-21 | 1981-01-21 | Step and repeat camera device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57120936A (enExample) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6054142U (ja) * | 1983-09-20 | 1985-04-16 | 日本電気株式会社 | 位置合わせ露光装置用チヤンバ− |
| JPS6197555A (ja) * | 1984-10-19 | 1986-05-16 | Tokyo Optical Co Ltd | 表面検査装置 |
| JPS61100932A (ja) * | 1984-10-24 | 1986-05-19 | Hitachi Ltd | 露光装置 |
| JPH0311612A (ja) * | 1989-06-07 | 1991-01-18 | Nec Yamagata Ltd | 露光装置 |
| JPH0350900U (enExample) * | 1989-09-21 | 1991-05-17 | ||
| JPH08255749A (ja) * | 1996-01-26 | 1996-10-01 | Hitachi Ltd | 露光方法 |
| JPH08279460A (ja) * | 1996-01-26 | 1996-10-22 | Hitachi Ltd | 露光装置 |
| JP2002139825A (ja) * | 2000-11-02 | 2002-05-17 | Ibiden Co Ltd | 露光用マスクの清掃方法および露光用マスクの清掃装置 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5386169A (en) * | 1977-01-07 | 1978-07-29 | Hitachi Ltd | Exposure apparatus |
| JPS5434777A (en) * | 1977-08-24 | 1979-03-14 | Hitachi Ltd | Mask aligner |
| JPS55102233A (en) * | 1979-01-30 | 1980-08-05 | Matsushita Electric Ind Co Ltd | Removing method of dust |
| JPS578435A (en) * | 1980-05-16 | 1982-01-16 | Gca Corp | Automatic detector for fine particle on wide ranging surface left optically unground |
-
1981
- 1981-01-21 JP JP636981A patent/JPS57120936A/ja active Granted
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5386169A (en) * | 1977-01-07 | 1978-07-29 | Hitachi Ltd | Exposure apparatus |
| JPS5434777A (en) * | 1977-08-24 | 1979-03-14 | Hitachi Ltd | Mask aligner |
| JPS55102233A (en) * | 1979-01-30 | 1980-08-05 | Matsushita Electric Ind Co Ltd | Removing method of dust |
| JPS578435A (en) * | 1980-05-16 | 1982-01-16 | Gca Corp | Automatic detector for fine particle on wide ranging surface left optically unground |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6054142U (ja) * | 1983-09-20 | 1985-04-16 | 日本電気株式会社 | 位置合わせ露光装置用チヤンバ− |
| JPS6197555A (ja) * | 1984-10-19 | 1986-05-16 | Tokyo Optical Co Ltd | 表面検査装置 |
| JPS61100932A (ja) * | 1984-10-24 | 1986-05-19 | Hitachi Ltd | 露光装置 |
| JPH0311612A (ja) * | 1989-06-07 | 1991-01-18 | Nec Yamagata Ltd | 露光装置 |
| JPH0350900U (enExample) * | 1989-09-21 | 1991-05-17 | ||
| JPH08255749A (ja) * | 1996-01-26 | 1996-10-01 | Hitachi Ltd | 露光方法 |
| JPH08279460A (ja) * | 1996-01-26 | 1996-10-22 | Hitachi Ltd | 露光装置 |
| JP2002139825A (ja) * | 2000-11-02 | 2002-05-17 | Ibiden Co Ltd | 露光用マスクの清掃方法および露光用マスクの清掃装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6323539B2 (enExample) | 1988-05-17 |
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