JPS57109333A - Patterning method by radiant ray beam - Google Patents
Patterning method by radiant ray beamInfo
- Publication number
- JPS57109333A JPS57109333A JP18582180A JP18582180A JPS57109333A JP S57109333 A JPS57109333 A JP S57109333A JP 18582180 A JP18582180 A JP 18582180A JP 18582180 A JP18582180 A JP 18582180A JP S57109333 A JPS57109333 A JP S57109333A
- Authority
- JP
- Japan
- Prior art keywords
- patterned
- pattern groups
- subcell
- ray beam
- split
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/302—Controlling tubes by external information, e.g. programme control
- H01J37/3023—Programme control
- H01J37/3026—Patterning strategy
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
Abstract
PURPOSE:To contrive high-speed patterning by a method wherein, after the patterning has been performed on every other split region of the prescribed number of a subcell, the remaining split regions are successively patterned, and a subcell is patterned by giving a plurality of scannings of radiant ray beam. CONSTITUTION:The subcells 2a-2i are formed into a single subcell 3, and the drawn pattern in the subcell is split in horizontal direction at the point where a sudden change occurs, and are divided into a plurality of pattern groups 4a-4e. Besides, the width in horizontal direction of the pattern groups 4a-4e is to be set at in such a manner that the positional change of an electron beam can be circuitously followed. Pattern groups 4a, 4c and 4e are patterned by scanning electron beam, in other words, the pattern groups 4a-4e are patterned every other group. Then, the remaining pattern groups 4b and 4d are patterned by performing the second scanning.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18582180A JPS57109333A (en) | 1980-12-26 | 1980-12-26 | Patterning method by radiant ray beam |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18582180A JPS57109333A (en) | 1980-12-26 | 1980-12-26 | Patterning method by radiant ray beam |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57109333A true JPS57109333A (en) | 1982-07-07 |
Family
ID=16177462
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18582180A Pending JPS57109333A (en) | 1980-12-26 | 1980-12-26 | Patterning method by radiant ray beam |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57109333A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6091633A (en) * | 1983-10-26 | 1985-05-23 | Toshiba Corp | Electron beam drawing process |
JPS60254616A (en) * | 1984-05-30 | 1985-12-16 | Fujitsu Ltd | Electron beam exposure |
-
1980
- 1980-12-26 JP JP18582180A patent/JPS57109333A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6091633A (en) * | 1983-10-26 | 1985-05-23 | Toshiba Corp | Electron beam drawing process |
JPH0582051B2 (en) * | 1983-10-26 | 1993-11-17 | Tokyo Shibaura Electric Co | |
JPS60254616A (en) * | 1984-05-30 | 1985-12-16 | Fujitsu Ltd | Electron beam exposure |
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