JPS5690267A - Inspecting device for condition of connection - Google Patents

Inspecting device for condition of connection

Info

Publication number
JPS5690267A
JPS5690267A JP16885379A JP16885379A JPS5690267A JP S5690267 A JPS5690267 A JP S5690267A JP 16885379 A JP16885379 A JP 16885379A JP 16885379 A JP16885379 A JP 16885379A JP S5690267 A JPS5690267 A JP S5690267A
Authority
JP
Japan
Prior art keywords
lead wire
component
retaining
connection
block
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16885379A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6133460B2 (enrdf_load_stackoverflow
Inventor
Motozo Sakoda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP16885379A priority Critical patent/JPS5690267A/ja
Publication of JPS5690267A publication Critical patent/JPS5690267A/ja
Publication of JPS6133460B2 publication Critical patent/JPS6133460B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP16885379A 1979-12-24 1979-12-24 Inspecting device for condition of connection Granted JPS5690267A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16885379A JPS5690267A (en) 1979-12-24 1979-12-24 Inspecting device for condition of connection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16885379A JPS5690267A (en) 1979-12-24 1979-12-24 Inspecting device for condition of connection

Publications (2)

Publication Number Publication Date
JPS5690267A true JPS5690267A (en) 1981-07-22
JPS6133460B2 JPS6133460B2 (enrdf_load_stackoverflow) 1986-08-02

Family

ID=15875754

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16885379A Granted JPS5690267A (en) 1979-12-24 1979-12-24 Inspecting device for condition of connection

Country Status (1)

Country Link
JP (1) JPS5690267A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5686670A (en) * 1996-11-20 1997-11-11 Vlsi Technology, Inc. Adjustable fixture for use with a wire pull tester

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62120547A (ja) * 1985-11-20 1987-06-01 Fuji Electric Co Ltd インサ−キツトエミユレ−タ接続方式
JPS6362043A (ja) * 1986-09-02 1988-03-18 Mitsubishi Electric Corp cpu搭載基板の試験方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5686670A (en) * 1996-11-20 1997-11-11 Vlsi Technology, Inc. Adjustable fixture for use with a wire pull tester

Also Published As

Publication number Publication date
JPS6133460B2 (enrdf_load_stackoverflow) 1986-08-02

Similar Documents

Publication Publication Date Title
GB2047805A (en) Injection nozzle clamp
JPS55101350A (en) Device for feeding workpiece
JPS5690267A (en) Inspecting device for condition of connection
GB2102575A (en) Eddy current sensor in a device for non-destructive testing of openings in articles and pipes and method of its manufacturing
JPS57124524A (en) Hemming work method
JPS5734641B2 (enrdf_load_stackoverflow)
JPS57155742A (en) Wafer prober
JPS57158571A (en) Measuring socket for small-sized semiconductor device
DE3872387D1 (de) Geraet zum erfassen einer garnbewegung.
JPS54140288A (en) Gang head locating device
JPS5542787A (en) Watch case spring rod fitting part hole-boring device
JPS53132311A (en) Pinch roller pressure-contacting device
SU550272A1 (ru) Способ ориентации деталей
JPS5717140A (en) Wire bonding device
JPS5597825A (en) Turnover device for pressed work
JPS57149746A (en) Tester for semiconductor substrate
JPS57102041A (en) Measuring jig of semicondutor device
JPS6461282A (en) Mark printing apparatus
JPS5741166A (en) Clamping device for work
JPS5795645A (en) Probing device
JPS5747539A (en) Metallic die for inspecting material of press machine
JPS6464749A (en) Method for loading workpiece onto machine
JPS57176732A (en) Positioning mechanism for integrated circuit
JPS5344757A (en) Sliding guide surfaces and working method therefor
MY126474A (en) Device for gripping and aligning an electronic component on a spindle