JPS5690267A - Inspecting device for condition of connection - Google Patents
Inspecting device for condition of connectionInfo
- Publication number
- JPS5690267A JPS5690267A JP16885379A JP16885379A JPS5690267A JP S5690267 A JPS5690267 A JP S5690267A JP 16885379 A JP16885379 A JP 16885379A JP 16885379 A JP16885379 A JP 16885379A JP S5690267 A JPS5690267 A JP S5690267A
- Authority
- JP
- Japan
- Prior art keywords
- lead wire
- component
- retaining
- connection
- block
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
PURPOSE: To enable correct inspection under the application of a fixed force by enabling the insepction of the condition of connection of a lead wire to a component by means of a machine.
CONSTITUTION: The tip of the device is opened by moving a retaining part 6 to the right and left together with a slider 7 and thereby a component 3 is chucked. On the occasion, a contacting part 9 is moved downward and the retaining part 6 is moved to the left since a roller 12 is positioned in the end part of the groove 11 of a groove cam 10. Retaining the component 3, the retaining part 6 moves to the right, and next a block 14 is lowered by the operation of a cylinder 17, whereby the lead wire is held between retaining parts 4 and 5. The block 14 is further lowered and thereby a pressing body 13 is made to contact with the lead wire 2. When the block 14 is further lowered downward, a force is applied to the lead wire 2 by a spring 15 and thus the fixed force is applied to the part of connection of the lead wire 2 with the component 3 in the direction of an arrow shown in the figure.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16885379A JPS5690267A (en) | 1979-12-24 | 1979-12-24 | Inspecting device for condition of connection |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16885379A JPS5690267A (en) | 1979-12-24 | 1979-12-24 | Inspecting device for condition of connection |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5690267A true JPS5690267A (en) | 1981-07-22 |
JPS6133460B2 JPS6133460B2 (en) | 1986-08-02 |
Family
ID=15875754
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16885379A Granted JPS5690267A (en) | 1979-12-24 | 1979-12-24 | Inspecting device for condition of connection |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5690267A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5686670A (en) * | 1996-11-20 | 1997-11-11 | Vlsi Technology, Inc. | Adjustable fixture for use with a wire pull tester |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62120547A (en) * | 1985-11-20 | 1987-06-01 | Fuji Electric Co Ltd | Connection system for in-circuit emulator |
JPS6362043A (en) * | 1986-09-02 | 1988-03-18 | Mitsubishi Electric Corp | Test method for cpu-mounted substrate |
-
1979
- 1979-12-24 JP JP16885379A patent/JPS5690267A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5686670A (en) * | 1996-11-20 | 1997-11-11 | Vlsi Technology, Inc. | Adjustable fixture for use with a wire pull tester |
Also Published As
Publication number | Publication date |
---|---|
JPS6133460B2 (en) | 1986-08-02 |
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