JPS5673450A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS5673450A
JPS5673450A JP15098179A JP15098179A JPS5673450A JP S5673450 A JPS5673450 A JP S5673450A JP 15098179 A JP15098179 A JP 15098179A JP 15098179 A JP15098179 A JP 15098179A JP S5673450 A JPS5673450 A JP S5673450A
Authority
JP
Japan
Prior art keywords
film
polycrystalline
laminated
constitution
type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15098179A
Other languages
Japanese (ja)
Inventor
Hisakazu Iizuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP15098179A priority Critical patent/JPS5673450A/en
Publication of JPS5673450A publication Critical patent/JPS5673450A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain an electrode containing a metal silicide having superior controllability by a method wherein an amorphous or a polycrystalline Si and a metal are laminated on a substrate, and after an energy beam is irradiated selectively to form the silicide, etching is performed on it. CONSTITUTION:Polycrystalline Si 4 and Mo 5 are laminated on oxide films 2, 3 on a p type Si substrate 1 and a thin polycrystalline Si film is formed selectively on it. When a laser beam is irradiated in pulse type on it, the laser beam is absorbed effectively at the adhering part of the film 6 to make the part to be a high temperature forming an MoSi2 film 7. After the part other than the film 7 is removed using an aqua regia and an alcoholic solution of KOH, As ions are implanted to form n<+> type layers 8, 9. Then the whole surface is covered with an SiO2 film 10, and openings are formed to adhere Al wirings 11. By this constitution, the homogeneous MoSi2 film is formed only in the wiring region, and the electrode wirings having a minute pattern can be formed having superior controllability utilizing the difference of etching speed without using a mask.
JP15098179A 1979-11-21 1979-11-21 Manufacture of semiconductor device Pending JPS5673450A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15098179A JPS5673450A (en) 1979-11-21 1979-11-21 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15098179A JPS5673450A (en) 1979-11-21 1979-11-21 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS5673450A true JPS5673450A (en) 1981-06-18

Family

ID=15508670

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15098179A Pending JPS5673450A (en) 1979-11-21 1979-11-21 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS5673450A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58154228A (en) * 1982-03-09 1983-09-13 Fujitsu Ltd Preparation of semiconductor device
JPS5961145A (en) * 1982-09-30 1984-04-07 Fujitsu Ltd Manufacture of semiconductor device
JP2013105881A (en) * 2011-11-14 2013-05-30 Renesas Electronics Corp Method for manufacturing semiconductor device
CN109234728A (en) * 2018-10-18 2019-01-18 江苏理工学院 A kind of molybdenum alloy surface laser melting coating preparation MoSi2The method of coating

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58154228A (en) * 1982-03-09 1983-09-13 Fujitsu Ltd Preparation of semiconductor device
JPS5961145A (en) * 1982-09-30 1984-04-07 Fujitsu Ltd Manufacture of semiconductor device
JP2013105881A (en) * 2011-11-14 2013-05-30 Renesas Electronics Corp Method for manufacturing semiconductor device
CN109234728A (en) * 2018-10-18 2019-01-18 江苏理工学院 A kind of molybdenum alloy surface laser melting coating preparation MoSi2The method of coating

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