JPS5671898A - Nonvolatile semiconductor memory device and its testing method - Google Patents
Nonvolatile semiconductor memory device and its testing methodInfo
- Publication number
- JPS5671898A JPS5671898A JP14791379A JP14791379A JPS5671898A JP S5671898 A JPS5671898 A JP S5671898A JP 14791379 A JP14791379 A JP 14791379A JP 14791379 A JP14791379 A JP 14791379A JP S5671898 A JPS5671898 A JP S5671898A
- Authority
- JP
- Japan
- Prior art keywords
- cell
- amplifier
- nonvolatile semiconductor
- semiconductor memory
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
- Read Only Memory (AREA)
- Non-Volatile Memory (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14791379A JPS5671898A (en) | 1979-11-15 | 1979-11-15 | Nonvolatile semiconductor memory device and its testing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14791379A JPS5671898A (en) | 1979-11-15 | 1979-11-15 | Nonvolatile semiconductor memory device and its testing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5671898A true JPS5671898A (en) | 1981-06-15 |
| JPS6221199B2 JPS6221199B2 (enExample) | 1987-05-11 |
Family
ID=15440929
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14791379A Granted JPS5671898A (en) | 1979-11-15 | 1979-11-15 | Nonvolatile semiconductor memory device and its testing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5671898A (enExample) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS589286A (ja) * | 1981-07-10 | 1983-01-19 | Toshiba Corp | 不揮発性半導体メモリ |
| JPS6151700A (ja) * | 1984-08-22 | 1986-03-14 | Hitachi Ltd | 半導体記憶装置 |
| JPS61172300A (ja) * | 1985-01-26 | 1986-08-02 | Toshiba Corp | 半導体記憶装置 |
| JPS62165795A (ja) * | 1986-01-17 | 1987-07-22 | Hitachi Ltd | 半導体記憶装置 |
| JPS63293800A (ja) * | 1987-05-27 | 1988-11-30 | Toshiba Corp | 不揮発性半導体メモリ |
| JPH03120698A (ja) * | 1989-10-03 | 1991-05-22 | Toshiba Corp | 半導体不揮発性記憶装置 |
| WO1996004658A1 (en) * | 1994-08-02 | 1996-02-15 | Memory Corporation Plc | Bit resolution optimising mechanism |
| US5936885A (en) * | 1998-02-23 | 1999-08-10 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory capable of preventing erroneous inversion of data read from memory transistors |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7499308B2 (en) * | 2007-03-21 | 2009-03-03 | International Business Machines Corporation | Programmable heavy-ion sensing device for accelerated DRAM soft error detection |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51140442A (en) * | 1975-05-13 | 1976-12-03 | Ncr Co | Memory circuit |
| JPS5263637A (en) * | 1975-11-20 | 1977-05-26 | Toshiba Corp | Device for non-volatile semiconductor memory |
-
1979
- 1979-11-15 JP JP14791379A patent/JPS5671898A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS51140442A (en) * | 1975-05-13 | 1976-12-03 | Ncr Co | Memory circuit |
| JPS5263637A (en) * | 1975-11-20 | 1977-05-26 | Toshiba Corp | Device for non-volatile semiconductor memory |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS589286A (ja) * | 1981-07-10 | 1983-01-19 | Toshiba Corp | 不揮発性半導体メモリ |
| JPS6151700A (ja) * | 1984-08-22 | 1986-03-14 | Hitachi Ltd | 半導体記憶装置 |
| JPS61172300A (ja) * | 1985-01-26 | 1986-08-02 | Toshiba Corp | 半導体記憶装置 |
| JPS62165795A (ja) * | 1986-01-17 | 1987-07-22 | Hitachi Ltd | 半導体記憶装置 |
| JPS63293800A (ja) * | 1987-05-27 | 1988-11-30 | Toshiba Corp | 不揮発性半導体メモリ |
| JPH03120698A (ja) * | 1989-10-03 | 1991-05-22 | Toshiba Corp | 半導体不揮発性記憶装置 |
| WO1996004658A1 (en) * | 1994-08-02 | 1996-02-15 | Memory Corporation Plc | Bit resolution optimising mechanism |
| US5936885A (en) * | 1998-02-23 | 1999-08-10 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory capable of preventing erroneous inversion of data read from memory transistors |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6221199B2 (enExample) | 1987-05-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS647635A (en) | Semiconductor integrated circuit device with gate array and memory | |
| JPS5786179A (en) | Random access memory device | |
| DE3069893D1 (en) | Method involving testing an electrically alterable microelectronic memory circuit | |
| JPS57105897A (en) | Semiconductor storage device | |
| JPS5671898A (en) | Nonvolatile semiconductor memory device and its testing method | |
| JPS5589980A (en) | Semiconductor memory unit | |
| ATE51319T1 (de) | Verfahren zur herstellung von einem polysiliciumswiderstand mit niedriger thermischer aktivierungsenergie. | |
| JPS52102642A (en) | Dynamic memory device | |
| JPS52153630A (en) | Semiconductor memory device | |
| JPS5457921A (en) | Sense amplifier circuit | |
| JPS5585264A (en) | Function test evaluation device for integrated circuit | |
| DE3682732D1 (de) | Pruefverfahren zur erkennung fehlerhafter speicherzellen in einem programmierbaren halbleitergeraet. | |
| JPS5589996A (en) | Test method for semiconductor memory unit and semiconductor memory unit suitable for it | |
| US3230452A (en) | Test apparatus for plotting the load characteristic curves of low power direct current power sources | |
| JPS5759115A (en) | Calibrating data writing method applied externally to information measuring device and information measuring device stored with calibra ting data | |
| JPS54146935A (en) | Mask programmable read/write memory | |
| JPS5558896A (en) | Analyzer for memory defect | |
| JPS61280582A (ja) | Mos半導体装置の測定方法 | |
| JPS5331951A (en) | Selection checking circuit | |
| JPS57200993A (en) | Semiconductor nonvolatile storage device | |
| JPS57172598A (en) | Nonvolatile semiconductor memory | |
| JPS5335584A (en) | Integration display apparatus of physical quantity | |
| JPS51142927A (en) | Memory function testing method for mos memory elements | |
| JPS53107001A (en) | Automatic testing device for vehicle | |
| JPS5472924A (en) | Semiconductor memory inspection equipment |