JPS5671898A - Nonvolatile semiconductor memory device and its testing method - Google Patents
Nonvolatile semiconductor memory device and its testing methodInfo
- Publication number
- JPS5671898A JPS5671898A JP14791379A JP14791379A JPS5671898A JP S5671898 A JPS5671898 A JP S5671898A JP 14791379 A JP14791379 A JP 14791379A JP 14791379 A JP14791379 A JP 14791379A JP S5671898 A JPS5671898 A JP S5671898A
- Authority
- JP
- Japan
- Prior art keywords
- cell
- amplifier
- nonvolatile semiconductor
- semiconductor memory
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Read Only Memory (AREA)
- Non-Volatile Memory (AREA)
Abstract
PURPOSE: To simply and accurately test the data storage characteristics of nonvolatile semiconductor memory, by connecting the differential type sense amplifier to which specified reference voltage is fed, to the reference cell the same lot as the memory cell.
CONSTITUTION: The memory cell 1 of the same manufacturing lot as the nonvolatile semiconductor memory cell in matrix arrangement is takne as the reference cell and the test use differential type sense amplifier 6 is connected to the cell 1. Further, a high reference voltage is fed from the reference potential terminal 8 to this amplifier 6 and the gain of the amplifier 6 is decreased, then the output of the amplifier 6 corresponds to the storage data of the cell 1 after time aging. Accordingly, the output of the amplifier 6 is measured via the test terminal 7, then the data storage characteristic test for nonvolatile semiconductor memory can easily and accurately be made.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14791379A JPS5671898A (en) | 1979-11-15 | 1979-11-15 | Nonvolatile semiconductor memory device and its testing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14791379A JPS5671898A (en) | 1979-11-15 | 1979-11-15 | Nonvolatile semiconductor memory device and its testing method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5671898A true JPS5671898A (en) | 1981-06-15 |
JPS6221199B2 JPS6221199B2 (en) | 1987-05-11 |
Family
ID=15440929
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14791379A Granted JPS5671898A (en) | 1979-11-15 | 1979-11-15 | Nonvolatile semiconductor memory device and its testing method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5671898A (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS589286A (en) * | 1981-07-10 | 1983-01-19 | Toshiba Corp | Nonvolatile semiconductor memory |
JPS6151700A (en) * | 1984-08-22 | 1986-03-14 | Hitachi Ltd | Semiconductor memory |
JPS61172300A (en) * | 1985-01-26 | 1986-08-02 | Toshiba Corp | Semiconductor memory device |
JPS62165795A (en) * | 1986-01-17 | 1987-07-22 | Hitachi Ltd | Semiconductor storage device |
JPS63293800A (en) * | 1987-05-27 | 1988-11-30 | Toshiba Corp | Non-volatile semiconductor memory |
JPH03120698A (en) * | 1989-10-03 | 1991-05-22 | Toshiba Corp | Semiconductor non-volatile storage device |
WO1996004658A1 (en) * | 1994-08-02 | 1996-02-15 | Memory Corporation Plc | Bit resolution optimising mechanism |
US5936885A (en) * | 1998-02-23 | 1999-08-10 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory capable of preventing erroneous inversion of data read from memory transistors |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7499308B2 (en) * | 2007-03-21 | 2009-03-03 | International Business Machines Corporation | Programmable heavy-ion sensing device for accelerated DRAM soft error detection |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51140442A (en) * | 1975-05-13 | 1976-12-03 | Ncr Co | Memory circuit |
JPS5263637A (en) * | 1975-11-20 | 1977-05-26 | Toshiba Corp | Device for non-volatile semiconductor memory |
-
1979
- 1979-11-15 JP JP14791379A patent/JPS5671898A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51140442A (en) * | 1975-05-13 | 1976-12-03 | Ncr Co | Memory circuit |
JPS5263637A (en) * | 1975-11-20 | 1977-05-26 | Toshiba Corp | Device for non-volatile semiconductor memory |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS589286A (en) * | 1981-07-10 | 1983-01-19 | Toshiba Corp | Nonvolatile semiconductor memory |
JPS6348120B2 (en) * | 1981-07-10 | 1988-09-27 | Tokyo Shibaura Electric Co | |
JPS6151700A (en) * | 1984-08-22 | 1986-03-14 | Hitachi Ltd | Semiconductor memory |
JPS61172300A (en) * | 1985-01-26 | 1986-08-02 | Toshiba Corp | Semiconductor memory device |
JPH0527200B2 (en) * | 1985-01-26 | 1993-04-20 | Tokyo Shibaura Electric Co | |
JPS62165795A (en) * | 1986-01-17 | 1987-07-22 | Hitachi Ltd | Semiconductor storage device |
JPS63293800A (en) * | 1987-05-27 | 1988-11-30 | Toshiba Corp | Non-volatile semiconductor memory |
JPH03120698A (en) * | 1989-10-03 | 1991-05-22 | Toshiba Corp | Semiconductor non-volatile storage device |
WO1996004658A1 (en) * | 1994-08-02 | 1996-02-15 | Memory Corporation Plc | Bit resolution optimising mechanism |
US5936885A (en) * | 1998-02-23 | 1999-08-10 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memory capable of preventing erroneous inversion of data read from memory transistors |
Also Published As
Publication number | Publication date |
---|---|
JPS6221199B2 (en) | 1987-05-11 |
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