JPS5660337A - Fluorescent x-ray analysis method - Google Patents

Fluorescent x-ray analysis method

Info

Publication number
JPS5660337A
JPS5660337A JP13597079A JP13597079A JPS5660337A JP S5660337 A JPS5660337 A JP S5660337A JP 13597079 A JP13597079 A JP 13597079A JP 13597079 A JP13597079 A JP 13597079A JP S5660337 A JPS5660337 A JP S5660337A
Authority
JP
Japan
Prior art keywords
fluorescent
upper face
ring spacer
sample
glass bead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13597079A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6338660B2 (online.php
Inventor
Hiroshi Onami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP13597079A priority Critical patent/JPS5660337A/ja
Publication of JPS5660337A publication Critical patent/JPS5660337A/ja
Publication of JPS6338660B2 publication Critical patent/JPS6338660B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP13597079A 1979-10-23 1979-10-23 Fluorescent x-ray analysis method Granted JPS5660337A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13597079A JPS5660337A (en) 1979-10-23 1979-10-23 Fluorescent x-ray analysis method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13597079A JPS5660337A (en) 1979-10-23 1979-10-23 Fluorescent x-ray analysis method

Publications (2)

Publication Number Publication Date
JPS5660337A true JPS5660337A (en) 1981-05-25
JPS6338660B2 JPS6338660B2 (online.php) 1988-08-01

Family

ID=15164112

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13597079A Granted JPS5660337A (en) 1979-10-23 1979-10-23 Fluorescent x-ray analysis method

Country Status (1)

Country Link
JP (1) JPS5660337A (online.php)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160084777A1 (en) * 2014-09-23 2016-03-24 Olympus Scientific Solutions Americas Inc. Spacer accessory for xrf handheld analyzers

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4110959Y1 (online.php) * 1965-11-11 1966-05-23
JPS5148394A (online.php) * 1974-10-23 1976-04-26 Hitachi Ltd
JPS5292786A (en) * 1976-01-30 1977-08-04 Hitachi Ltd Ion microanalyzer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4110959Y1 (online.php) * 1965-11-11 1966-05-23
JPS5148394A (online.php) * 1974-10-23 1976-04-26 Hitachi Ltd
JPS5292786A (en) * 1976-01-30 1977-08-04 Hitachi Ltd Ion microanalyzer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160084777A1 (en) * 2014-09-23 2016-03-24 Olympus Scientific Solutions Americas Inc. Spacer accessory for xrf handheld analyzers
US9746432B2 (en) * 2014-09-23 2017-08-29 Olympus Scientific Solutions Americas Inc. Spacer accessory for XRF handheld analyzers

Also Published As

Publication number Publication date
JPS6338660B2 (online.php) 1988-08-01

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