JPS6338660B2 - - Google Patents
Info
- Publication number
- JPS6338660B2 JPS6338660B2 JP54135970A JP13597079A JPS6338660B2 JP S6338660 B2 JPS6338660 B2 JP S6338660B2 JP 54135970 A JP54135970 A JP 54135970A JP 13597079 A JP13597079 A JP 13597079A JP S6338660 B2 JPS6338660 B2 JP S6338660B2
- Authority
- JP
- Japan
- Prior art keywords
- fluorescent
- glass bead
- annular spacer
- sample
- analysis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13597079A JPS5660337A (en) | 1979-10-23 | 1979-10-23 | Fluorescent x-ray analysis method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13597079A JPS5660337A (en) | 1979-10-23 | 1979-10-23 | Fluorescent x-ray analysis method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5660337A JPS5660337A (en) | 1981-05-25 |
| JPS6338660B2 true JPS6338660B2 (online.php) | 1988-08-01 |
Family
ID=15164112
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13597079A Granted JPS5660337A (en) | 1979-10-23 | 1979-10-23 | Fluorescent x-ray analysis method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5660337A (online.php) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9746432B2 (en) * | 2014-09-23 | 2017-08-29 | Olympus Scientific Solutions Americas Inc. | Spacer accessory for XRF handheld analyzers |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4110959Y1 (online.php) * | 1965-11-11 | 1966-05-23 | ||
| JPS5148394A (online.php) * | 1974-10-23 | 1976-04-26 | Hitachi Ltd | |
| JPS5292786A (en) * | 1976-01-30 | 1977-08-04 | Hitachi Ltd | Ion microanalyzer |
-
1979
- 1979-10-23 JP JP13597079A patent/JPS5660337A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5660337A (en) | 1981-05-25 |
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