JPS5660337A - Fluorescent x-ray analysis method - Google Patents
Fluorescent x-ray analysis methodInfo
- Publication number
- JPS5660337A JPS5660337A JP13597079A JP13597079A JPS5660337A JP S5660337 A JPS5660337 A JP S5660337A JP 13597079 A JP13597079 A JP 13597079A JP 13597079 A JP13597079 A JP 13597079A JP S5660337 A JPS5660337 A JP S5660337A
- Authority
- JP
- Japan
- Prior art keywords
- fluorescent
- upper face
- ring spacer
- sample
- glass bead
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To analyze fluorescent X-rays of a glass bead sample with a high precision by protruding a ring spacer to the outside circumference of the fluorescent irradiation window and by bringing it into contact with the upper face except the upward curved face of the sample upper face. CONSTITUTION:Ring spacer 1 is protruded to the outside circumference of irradiation window x2 in front of fluorescent X-ray bulb x1. Front end circumference part 1a of ring spacer 1 is brought into contact with the upper face except upward curved face EF near the circumference edge of the upper face of glass bead sample GB to irradiate fluorescent X rays to glass bead sample upper face CF surrounded with front end circumference part 1a of ring spacer 1. As a result, the fluorescent X-ray irradiation distance for flat face CF of the sample is kept constant, and fluorescent X-ray analysis can be performed easily and rapidly without correction of the irradiation distance.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13597079A JPS5660337A (en) | 1979-10-23 | 1979-10-23 | Fluorescent x-ray analysis method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13597079A JPS5660337A (en) | 1979-10-23 | 1979-10-23 | Fluorescent x-ray analysis method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5660337A true JPS5660337A (en) | 1981-05-25 |
JPS6338660B2 JPS6338660B2 (en) | 1988-08-01 |
Family
ID=15164112
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13597079A Granted JPS5660337A (en) | 1979-10-23 | 1979-10-23 | Fluorescent x-ray analysis method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5660337A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20160084777A1 (en) * | 2014-09-23 | 2016-03-24 | Olympus Scientific Solutions Americas Inc. | Spacer accessory for xrf handheld analyzers |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4110959Y1 (en) * | 1965-11-11 | 1966-05-23 | ||
JPS5148394A (en) * | 1974-10-23 | 1976-04-26 | Hitachi Ltd | |
JPS5292786A (en) * | 1976-01-30 | 1977-08-04 | Hitachi Ltd | Ion microanalyzer |
-
1979
- 1979-10-23 JP JP13597079A patent/JPS5660337A/en active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4110959Y1 (en) * | 1965-11-11 | 1966-05-23 | ||
JPS5148394A (en) * | 1974-10-23 | 1976-04-26 | Hitachi Ltd | |
JPS5292786A (en) * | 1976-01-30 | 1977-08-04 | Hitachi Ltd | Ion microanalyzer |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20160084777A1 (en) * | 2014-09-23 | 2016-03-24 | Olympus Scientific Solutions Americas Inc. | Spacer accessory for xrf handheld analyzers |
US9746432B2 (en) * | 2014-09-23 | 2017-08-29 | Olympus Scientific Solutions Americas Inc. | Spacer accessory for XRF handheld analyzers |
Also Published As
Publication number | Publication date |
---|---|
JPS6338660B2 (en) | 1988-08-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB1446818A (en) | Method and apparatus for examining a sample by measuring the absorption of ypsilon- or x-ray radiation | |
JPS5660337A (en) | Fluorescent x-ray analysis method | |
US4571665B1 (en) | ||
JPS57197454A (en) | X-ray analysing apparatus | |
JPS5581438A (en) | Manufacturing method of fluorescent display tube grid | |
ES2000982A6 (en) | X-ray image intensifier tube having an optimized microstructure. | |
JPS52134786A (en) | Radiation detector | |
GB816412A (en) | Improved silica glass and process for its manufacture | |
JPS5227695A (en) | Micro-part x-ray analysis apparatus | |
Zelle et al. | Differential photoreactivation of Escherichia coli after exposure to 2650 and 2250 A ultraviolet. | |
JPS52123831A (en) | Cothode ray tube | |
JPS5212875A (en) | Electron-cooled type device for detecting rays of radiant light | |
JPS5237553A (en) | Method for improving the life time of irradiation window of a reactor for treating exhaust gas irradiated with radiation | |
JPS51134687A (en) | Atomic extinction analysis method | |
JPS52149193A (en) | Method of and apparatus for analyzing cathode luminescence | |
JPS5245392A (en) | Device for preparation of glass bead sample for fluorescent x-ray anal ysis | |
JPS55113737A (en) | Preparation of acetic acid and/or propionic acid from methane, co2 and/or co | |
Moschini et al. | Dosimetry and Hazards of Neutrons at Energies Between 15 and 50 MeV. | |
JPS5211980A (en) | Phosphor analysis apparatus | |
JPS543593A (en) | Solid surface analyzer | |
Vajda | Determination of Arsenic and Antimony in Steels by Atomic Absorption Spectroscopy | |
JPS5437388A (en) | Discharge lamp | |
JPS535691A (en) | Analyzing method for impurity in carbon fluoride | |
IT1068707B (en) | PROCEDURE TO MINIMIZE THE BREAKAGE OF PYROLITHIC CARBON COATINGS OF FERTILE AND FOSSIL NUCLEAR PARTICLES AND OBTAINED PARTICLES | |
JPS54148997A (en) | Method of detecting uniformity of crossssectional intensity of electron rays |