JPS5227695A - Micro-part x-ray analysis apparatus - Google Patents

Micro-part x-ray analysis apparatus

Info

Publication number
JPS5227695A
JPS5227695A JP50102923A JP10292375A JPS5227695A JP S5227695 A JPS5227695 A JP S5227695A JP 50102923 A JP50102923 A JP 50102923A JP 10292375 A JP10292375 A JP 10292375A JP S5227695 A JPS5227695 A JP S5227695A
Authority
JP
Japan
Prior art keywords
micro
analysis apparatus
ray analysis
kinds
give
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50102923A
Other languages
Japanese (ja)
Inventor
Ryoji Fujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP50102923A priority Critical patent/JPS5227695A/en
Publication of JPS5227695A publication Critical patent/JPS5227695A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:The apparatus is so composed that the size of X-ray take-out windows can be changed to give an optimum radiation area according to the kinds of spectral crystal, whereby final L-B ratio is improved.
JP50102923A 1975-08-27 1975-08-27 Micro-part x-ray analysis apparatus Pending JPS5227695A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50102923A JPS5227695A (en) 1975-08-27 1975-08-27 Micro-part x-ray analysis apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50102923A JPS5227695A (en) 1975-08-27 1975-08-27 Micro-part x-ray analysis apparatus

Publications (1)

Publication Number Publication Date
JPS5227695A true JPS5227695A (en) 1977-03-02

Family

ID=14340364

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50102923A Pending JPS5227695A (en) 1975-08-27 1975-08-27 Micro-part x-ray analysis apparatus

Country Status (1)

Country Link
JP (1) JPS5227695A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4423031A (en) * 1979-11-08 1983-12-27 Shiseido Company, Ltd. Eye makeup preparation
US5408512A (en) * 1993-04-23 1995-04-18 Shimadzu Corporation Local analysis of a specimen in an X-ray fluorescence spectrometer
US5948393A (en) * 1992-11-30 1999-09-07 Shiseido Company, Ltd. Make-up cosmetic composition
JP2007093581A (en) * 2005-09-01 2007-04-12 Jeol Ltd Wavelength dispersive x-ray spectrometer

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4423031A (en) * 1979-11-08 1983-12-27 Shiseido Company, Ltd. Eye makeup preparation
US5948393A (en) * 1992-11-30 1999-09-07 Shiseido Company, Ltd. Make-up cosmetic composition
US5408512A (en) * 1993-04-23 1995-04-18 Shimadzu Corporation Local analysis of a specimen in an X-ray fluorescence spectrometer
JP2007093581A (en) * 2005-09-01 2007-04-12 Jeol Ltd Wavelength dispersive x-ray spectrometer
US7864922B2 (en) 2005-09-01 2011-01-04 Jeol Ltd. Wavelength-dispersive X-ray spectrometer

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