JPS5292777A - Xxray spectrometer - Google Patents

Xxray spectrometer

Info

Publication number
JPS5292777A
JPS5292777A JP956976A JP956976A JPS5292777A JP S5292777 A JPS5292777 A JP S5292777A JP 956976 A JP956976 A JP 956976A JP 956976 A JP956976 A JP 956976A JP S5292777 A JPS5292777 A JP S5292777A
Authority
JP
Japan
Prior art keywords
wavelength
spectrometer
xxray
rays
intensity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP956976A
Other languages
Japanese (ja)
Other versions
JPS6140935B2 (en
Inventor
Teiichi Shimomura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP956976A priority Critical patent/JPS5292777A/en
Publication of JPS5292777A publication Critical patent/JPS5292777A/en
Publication of JPS6140935B2 publication Critical patent/JPS6140935B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To provide a X-ray spectrometer, comprising means for linear driving of wavelength, so that relationship between intensity of X-rays and wavelength can be directly detected and it is enabled to indicate intensity of X-rays at uniform intervals of wavelength (linear scanning of wavelength).
JP956976A 1976-01-30 1976-01-30 Xxray spectrometer Granted JPS5292777A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP956976A JPS5292777A (en) 1976-01-30 1976-01-30 Xxray spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP956976A JPS5292777A (en) 1976-01-30 1976-01-30 Xxray spectrometer

Publications (2)

Publication Number Publication Date
JPS5292777A true JPS5292777A (en) 1977-08-04
JPS6140935B2 JPS6140935B2 (en) 1986-09-11

Family

ID=11723918

Family Applications (1)

Application Number Title Priority Date Filing Date
JP956976A Granted JPS5292777A (en) 1976-01-30 1976-01-30 Xxray spectrometer

Country Status (1)

Country Link
JP (1) JPS5292777A (en)

Also Published As

Publication number Publication date
JPS6140935B2 (en) 1986-09-11

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