JPS5655839A - Monitoring method for gas - Google Patents

Monitoring method for gas

Info

Publication number
JPS5655839A
JPS5655839A JP13212679A JP13212679A JPS5655839A JP S5655839 A JPS5655839 A JP S5655839A JP 13212679 A JP13212679 A JP 13212679A JP 13212679 A JP13212679 A JP 13212679A JP S5655839 A JPS5655839 A JP S5655839A
Authority
JP
Japan
Prior art keywords
area
laser beams
source
monitored
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13212679A
Other languages
English (en)
Inventor
Hirobumi Kashiwara
Hiroyuki Ishizaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP13212679A priority Critical patent/JPS5655839A/ja
Publication of JPS5655839A publication Critical patent/JPS5655839A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Fire-Detection Mechanisms (AREA)
  • Emergency Alarm Devices (AREA)
JP13212679A 1979-10-13 1979-10-13 Monitoring method for gas Pending JPS5655839A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13212679A JPS5655839A (en) 1979-10-13 1979-10-13 Monitoring method for gas

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13212679A JPS5655839A (en) 1979-10-13 1979-10-13 Monitoring method for gas

Publications (1)

Publication Number Publication Date
JPS5655839A true JPS5655839A (en) 1981-05-16

Family

ID=15074004

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13212679A Pending JPS5655839A (en) 1979-10-13 1979-10-13 Monitoring method for gas

Country Status (1)

Country Link
JP (1) JPS5655839A (ja)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5897644A (ja) * 1981-12-08 1983-06-10 Olympus Optical Co Ltd 自動文析装置の測光方法
EP0318752A2 (de) * 1987-12-03 1989-06-07 Techform Engineering Ag System zur Spuren- Gasanalyse
JPH03106449U (ja) * 1990-02-14 1991-11-01
JP2004219379A (ja) * 2003-01-17 2004-08-05 Mitsubishi Heavy Ind Ltd ガス濃度モニタリングシステム
KR101121821B1 (ko) * 2009-03-26 2012-03-21 현대제철 주식회사 백필터 소손 검출 장치 및 그 방법
JP2014020801A (ja) * 2012-07-12 2014-02-03 Mitsubishi Heavy Ind Ltd 濃度分布測定装置及び脱硝装置
JP2014102098A (ja) * 2012-11-16 2014-06-05 Mitsubishi Heavy Ind Ltd 排ガス脱硝装置の触媒診断システム及び方法
JP2014100630A (ja) * 2012-11-16 2014-06-05 Mitsubishi Heavy Ind Ltd 排ガス脱硝システム
JP2015127687A (ja) * 2013-12-27 2015-07-09 三菱重工業株式会社 ガス成分濃度分布測定装置及び排ガス脱硝システム

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52126200A (en) * 1976-04-15 1977-10-22 Matsushita Electric Works Ltd Distribution-type smoke sensor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52126200A (en) * 1976-04-15 1977-10-22 Matsushita Electric Works Ltd Distribution-type smoke sensor

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5897644A (ja) * 1981-12-08 1983-06-10 Olympus Optical Co Ltd 自動文析装置の測光方法
EP0318752A2 (de) * 1987-12-03 1989-06-07 Techform Engineering Ag System zur Spuren- Gasanalyse
JPH03106449U (ja) * 1990-02-14 1991-11-01
JP2004219379A (ja) * 2003-01-17 2004-08-05 Mitsubishi Heavy Ind Ltd ガス濃度モニタリングシステム
KR101121821B1 (ko) * 2009-03-26 2012-03-21 현대제철 주식회사 백필터 소손 검출 장치 및 그 방법
JP2014020801A (ja) * 2012-07-12 2014-02-03 Mitsubishi Heavy Ind Ltd 濃度分布測定装置及び脱硝装置
JP2014102098A (ja) * 2012-11-16 2014-06-05 Mitsubishi Heavy Ind Ltd 排ガス脱硝装置の触媒診断システム及び方法
JP2014100630A (ja) * 2012-11-16 2014-06-05 Mitsubishi Heavy Ind Ltd 排ガス脱硝システム
JP2015127687A (ja) * 2013-12-27 2015-07-09 三菱重工業株式会社 ガス成分濃度分布測定装置及び排ガス脱硝システム

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