JPS52154688A - Detection of faults on surface of metal plate moving at high speed - Google Patents

Detection of faults on surface of metal plate moving at high speed

Info

Publication number
JPS52154688A
JPS52154688A JP7101576A JP7101576A JPS52154688A JP S52154688 A JPS52154688 A JP S52154688A JP 7101576 A JP7101576 A JP 7101576A JP 7101576 A JP7101576 A JP 7101576A JP S52154688 A JPS52154688 A JP S52154688A
Authority
JP
Japan
Prior art keywords
high speed
faults
detection
metal plate
plate moving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7101576A
Other languages
Japanese (ja)
Inventor
Isamu Ichijima
Takao Sugimoto
Kazuo Miyagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP7101576A priority Critical patent/JPS52154688A/en
Publication of JPS52154688A publication Critical patent/JPS52154688A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To detect surface faults at high speed and with high precision by minimizing the scan pitch with the use of plural sets of laser beams varying in wave length and polarization characteristic.
JP7101576A 1976-06-18 1976-06-18 Detection of faults on surface of metal plate moving at high speed Pending JPS52154688A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7101576A JPS52154688A (en) 1976-06-18 1976-06-18 Detection of faults on surface of metal plate moving at high speed

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7101576A JPS52154688A (en) 1976-06-18 1976-06-18 Detection of faults on surface of metal plate moving at high speed

Publications (1)

Publication Number Publication Date
JPS52154688A true JPS52154688A (en) 1977-12-22

Family

ID=13448249

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7101576A Pending JPS52154688A (en) 1976-06-18 1976-06-18 Detection of faults on surface of metal plate moving at high speed

Country Status (1)

Country Link
JP (1) JPS52154688A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55149829A (en) * 1979-05-11 1980-11-21 Hitachi Ltd Detector for foreign matter in wafer
JPS5684535A (en) * 1979-12-14 1981-07-09 Hitachi Ltd Automatic detecting device for alien substance
JPS6475946A (en) * 1987-09-18 1989-03-22 Fuji Photo Film Co Ltd Surface inspecting apparatus
JP2010218926A (en) * 2009-03-17 2010-09-30 Jst Mfg Co Ltd Electric connector with caulking shell, and shield cable harness

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55149829A (en) * 1979-05-11 1980-11-21 Hitachi Ltd Detector for foreign matter in wafer
JPH0159522B2 (en) * 1979-05-11 1989-12-18 Hitachi Ltd
JPS5684535A (en) * 1979-12-14 1981-07-09 Hitachi Ltd Automatic detecting device for alien substance
JPS6475946A (en) * 1987-09-18 1989-03-22 Fuji Photo Film Co Ltd Surface inspecting apparatus
JP2010218926A (en) * 2009-03-17 2010-09-30 Jst Mfg Co Ltd Electric connector with caulking shell, and shield cable harness

Similar Documents

Publication Publication Date Title
JPS5266485A (en) Scar searching apparatus
JPS52154688A (en) Detection of faults on surface of metal plate moving at high speed
JPS52119331A (en) Laser recording device
JPS51137443A (en) Method for measuring dimensions of three-dimensional structures
JPS522452A (en) Method and apparatus for measuring plate thickness
JPS5237462A (en) Method of measuring shape of flat plates
JPS522547A (en) Optical method to measure displacement of plane
JPS5271289A (en) Surface inspection device
JPS53108860A (en) Zigzag travel correcting method
JPS52129545A (en) Method and apparatus for measurement of uniformity in surface roughnes s
JPS5216284A (en) Detecting method of fatigue
JPS51140749A (en) Pulse echo system
JPS52127259A (en) Observing surface sharpe
JPS5337456A (en) Distance measuring device
JPS5214477A (en) Method to detect a defect in a transparent test object
JPS5220859A (en) Direction signal generator
JPS5211975A (en) Supersonic flaw detector
JPS5658659A (en) Measuring method of grain size of steel material using pulse laser light
JPS5342002A (en) Method for inspection of magnetic recording medium
JPS5296825A (en) Coordinates readout unit
JPS5293388A (en) Detection of flaw size in surface wave ultrasonic flaw probing
JPS52117578A (en) Electron beam exposing method
JPS5310483A (en) Surface wave flaw detection
JPS5383673A (en) Ultrasonic inspector
JPS5253450A (en) Suppersonic device for measuring thickness