JPS51136479A - Automatic flaw inspector - Google Patents

Automatic flaw inspector

Info

Publication number
JPS51136479A
JPS51136479A JP6025875A JP6025875A JPS51136479A JP S51136479 A JPS51136479 A JP S51136479A JP 6025875 A JP6025875 A JP 6025875A JP 6025875 A JP6025875 A JP 6025875A JP S51136479 A JPS51136479 A JP S51136479A
Authority
JP
Japan
Prior art keywords
decision
automatic flaw
flaws
inspector
flaw inspector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6025875A
Other languages
Japanese (ja)
Other versions
JPS5725779B2 (en
Inventor
Yoshiyuki Nakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyo Kohan Co Ltd
Original Assignee
Toyo Kohan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyo Kohan Co Ltd filed Critical Toyo Kohan Co Ltd
Priority to JP6025875A priority Critical patent/JPS51136479A/en
Publication of JPS51136479A publication Critical patent/JPS51136479A/en
Publication of JPS5725779B2 publication Critical patent/JPS5725779B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To enable numerical decision by memorized number of flaw signal detected for long distance of an iron hoop, correct decision by a statistice method of distribution, order, number of flaws, etc. with the memory of the numerical decision, and detection of continuous occurance of defects of little flaws falling in a range of allowance.
JP6025875A 1975-05-22 1975-05-22 Automatic flaw inspector Granted JPS51136479A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6025875A JPS51136479A (en) 1975-05-22 1975-05-22 Automatic flaw inspector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6025875A JPS51136479A (en) 1975-05-22 1975-05-22 Automatic flaw inspector

Publications (2)

Publication Number Publication Date
JPS51136479A true JPS51136479A (en) 1976-11-25
JPS5725779B2 JPS5725779B2 (en) 1982-06-01

Family

ID=13136952

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6025875A Granted JPS51136479A (en) 1975-05-22 1975-05-22 Automatic flaw inspector

Country Status (1)

Country Link
JP (1) JPS51136479A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53129350U (en) * 1977-03-22 1978-10-14

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53129350U (en) * 1977-03-22 1978-10-14

Also Published As

Publication number Publication date
JPS5725779B2 (en) 1982-06-01

Similar Documents

Publication Publication Date Title
DK601485D0 (en) METHOD AND APPARATUS FOR AUTOMATIC INSPECTION OF TRANSPARENT CONTAINERS FOR SIDE WALL AND DIMENSIONAL DEFECTS
CA959937A (en) Non-destructive testing apparatus for detecting both transverse and longitudinal weld defects with a single inspection
JPS5223986A (en) Method of detecting surface flaws
JPS51136479A (en) Automatic flaw inspector
JPS5365777A (en) Surface defect detector
ES462174A1 (en) Apparatus and method for inspecting glass containers
JPS5372679A (en) Surface defect detection of test piece
JPS5222983A (en) System for detecting defects of glass bottle mouths
JPS5312377A (en) Inspecting apparatus for surface
JPS539186A (en) Discrimination level setter of defect inspecting apparatus
CA947397A (en) Method and apparatus for detecting and marking defects in articles
JPS5279988A (en) Radiation type tire inspecting apparatus
JPS51128587A (en) Dyeing permeance flaw detector with anti corrosion
JPS5276985A (en) Flaw detector
JPS57132054A (en) Flaw detector
CA974596A (en) Method and apparatus for testing welded pipe for anomalies with means to change the sensitivity when testing the welded area
JPS5317383A (en) Non-contactive detecting method and apparatus for defect in shape of strip type inspected body
JPS5231784A (en) Ultrasonic flaw detection method for welded steel pipe ends
JPS5767852A (en) Method and apparatus for flaw detection
JPS541684A (en) Operation checking device of defect inspecting apparatus
JPS52138185A (en) Inspection apparatus for glass bottle or the like
JPS543588A (en) Coating defect detecting apparatus of sheet-form objects
JPS5440686A (en) Defect inspector
JPS5247791A (en) Eddy current flaw detecting method
JPS5224553A (en) Surface inspection device