JPS5649556A - Mos integrated circuit - Google Patents
Mos integrated circuitInfo
- Publication number
- JPS5649556A JPS5649556A JP12500079A JP12500079A JPS5649556A JP S5649556 A JPS5649556 A JP S5649556A JP 12500079 A JP12500079 A JP 12500079A JP 12500079 A JP12500079 A JP 12500079A JP S5649556 A JPS5649556 A JP S5649556A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- pad
- self
- bias circuit
- back bias
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 abstract 4
- 238000005229 chemical vapour deposition Methods 0.000 abstract 1
- 230000003647 oxidation Effects 0.000 abstract 1
- 238000007254 oxidation reaction Methods 0.000 abstract 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0214—Particular design considerations for integrated circuits for internal polarisation, e.g. I2L
- H01L27/0218—Particular design considerations for integrated circuits for internal polarisation, e.g. I2L of field effect structures
- H01L27/0222—Charge pumping, substrate bias generation structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/0212—Auxiliary members for bonding areas, e.g. spacers
- H01L2224/02122—Auxiliary members for bonding areas, e.g. spacers being formed on the semiconductor or solid-state body
- H01L2224/02163—Auxiliary members for bonding areas, e.g. spacers being formed on the semiconductor or solid-state body on the bonding area
- H01L2224/02165—Reinforcing structures
- H01L2224/02166—Collar structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0555—Shape
- H01L2224/05552—Shape in top view
- H01L2224/05554—Shape in top view being square
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:To normalize the operation of a self-back bias circuit with substrate potential stabilized by letting induced charge go to a power source through a large capacity formed between the underside of a junction pad as input and output terminals and a substrate and connected to the source. CONSTITUTION:When a plurality of N-channel gates are formed on a P type Si substrate 1, a field oxide film 2 under the site range of a junction pad to be provided is selectively removed, a thermal oxidation film 3 and a poly-Si conductive film 4 somewhat larger than an Al pad 6 are stacked, and the film 4 is grounded. Next, SiO25 is stacked by CVD method and an Al pad 6 to be connected to input or output circuits is formed, and covered with a PSG 7. Further a self-back bias circuit is provided in addition to an N-channel gate. Thereby, the charge induced between the substrate and a capacity part due to the charge pump effect can be effectively let go to a power source upon operation, the single-source power supply and speed- up to a high level of the self-back bias circuit become possible and an MOSIC can be obtaind for normal circuit operation.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12500079A JPS5649556A (en) | 1979-09-28 | 1979-09-28 | Mos integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12500079A JPS5649556A (en) | 1979-09-28 | 1979-09-28 | Mos integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5649556A true JPS5649556A (en) | 1981-05-06 |
Family
ID=14899395
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12500079A Pending JPS5649556A (en) | 1979-09-28 | 1979-09-28 | Mos integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5649556A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5983053U (en) * | 1982-11-26 | 1984-06-05 | 日本電気株式会社 | integrated circuit |
JPS6073258U (en) * | 1983-10-25 | 1985-05-23 | 日本電気株式会社 | integrated circuit |
-
1979
- 1979-09-28 JP JP12500079A patent/JPS5649556A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5983053U (en) * | 1982-11-26 | 1984-06-05 | 日本電気株式会社 | integrated circuit |
JPH0438529Y2 (en) * | 1982-11-26 | 1992-09-09 | ||
JPS6073258U (en) * | 1983-10-25 | 1985-05-23 | 日本電気株式会社 | integrated circuit |
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