JPS5643639A - Photographic etching method - Google Patents

Photographic etching method

Info

Publication number
JPS5643639A
JPS5643639A JP11968179A JP11968179A JPS5643639A JP S5643639 A JPS5643639 A JP S5643639A JP 11968179 A JP11968179 A JP 11968179A JP 11968179 A JP11968179 A JP 11968179A JP S5643639 A JPS5643639 A JP S5643639A
Authority
JP
Japan
Prior art keywords
resist
pattern
postbaking
width
photosensitive resin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11968179A
Other languages
English (en)
Inventor
Hideaki Shimoda
Kayoko Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP11968179A priority Critical patent/JPS5643639A/ja
Publication of JPS5643639A publication Critical patent/JPS5643639A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G03F7/2022—Multi-step exposure, e.g. hybrid; backside exposure; blanket exposure, e.g. for image reversal; edge exposure, e.g. for edge bead removal; corrective exposure
    • G03F7/2024—Multi-step exposure, e.g. hybrid; backside exposure; blanket exposure, e.g. for image reversal; edge exposure, e.g. for edge bead removal; corrective exposure of the already developed image

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP11968179A 1979-09-17 1979-09-17 Photographic etching method Pending JPS5643639A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11968179A JPS5643639A (en) 1979-09-17 1979-09-17 Photographic etching method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11968179A JPS5643639A (en) 1979-09-17 1979-09-17 Photographic etching method

Publications (1)

Publication Number Publication Date
JPS5643639A true JPS5643639A (en) 1981-04-22

Family

ID=14767407

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11968179A Pending JPS5643639A (en) 1979-09-17 1979-09-17 Photographic etching method

Country Status (1)

Country Link
JP (1) JPS5643639A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7799515B2 (en) 2002-04-04 2010-09-21 Semiconductor Energy Laboratory Co., Ltd. Method of fabricating semiconductor device, and developing apparatus using the method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7799515B2 (en) 2002-04-04 2010-09-21 Semiconductor Energy Laboratory Co., Ltd. Method of fabricating semiconductor device, and developing apparatus using the method

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