JPS56137348A - Negative type ionized radiation sensitive resist - Google Patents
Negative type ionized radiation sensitive resistInfo
- Publication number
- JPS56137348A JPS56137348A JP4008280A JP4008280A JPS56137348A JP S56137348 A JPS56137348 A JP S56137348A JP 4008280 A JP4008280 A JP 4008280A JP 4008280 A JP4008280 A JP 4008280A JP S56137348 A JPS56137348 A JP S56137348A
- Authority
- JP
- Japan
- Prior art keywords
- resist
- ionized radiation
- negative type
- radiation sensitive
- monomer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0388—Macromolecular compounds which are rendered insoluble or differentially wettable with ethylenic or acetylenic bands in the side chains of the photopolymer
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
Abstract
PURPOSE:To obtain a negative type resist sensitive to ionized radiation by using a halogenated allyl ester of acrylic acid or methacrylic acid. CONSTITUTION:A polymer represented by the formula (where R is H or CH3 and X is halogen such as F or Cl) or a copolymer of the monomer and other monomer is dissolved in a solvent to prepare a resist soln. This soln. is applied to a semiconductor substrate or a mask substrate with a spinner, dried, and prebaked. The resulting film is then exposed to ionized radiation such as electron beams or X-rays and developed. By introducing halogenated allyl groups, the polymer shows high cross-linkability to radiation and is provided with superhigh sensitivity as a resist, and a high- density resist pattern of submicron unit can be formed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4008280A JPS56137348A (en) | 1980-03-28 | 1980-03-28 | Negative type ionized radiation sensitive resist |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4008280A JPS56137348A (en) | 1980-03-28 | 1980-03-28 | Negative type ionized radiation sensitive resist |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56137348A true JPS56137348A (en) | 1981-10-27 |
JPS6311654B2 JPS6311654B2 (en) | 1988-03-15 |
Family
ID=12570973
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4008280A Granted JPS56137348A (en) | 1980-03-28 | 1980-03-28 | Negative type ionized radiation sensitive resist |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56137348A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5024969A (en) * | 1990-02-23 | 1991-06-18 | Reche John J | Hybrid circuit structure fabrication methods using high energy electron beam curing |
-
1980
- 1980-03-28 JP JP4008280A patent/JPS56137348A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5024969A (en) * | 1990-02-23 | 1991-06-18 | Reche John J | Hybrid circuit structure fabrication methods using high energy electron beam curing |
Also Published As
Publication number | Publication date |
---|---|
JPS6311654B2 (en) | 1988-03-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS57196231A (en) | Mixture able to be polymerized by radiation and copying material mainly composed thereof | |
ES480851A1 (en) | Article comprising a substrate and an overlying layer of electron beam radiation-sensitive material and process for fabrication thereof. | |
JPS5511217A (en) | Pattern forming method using radiation sensitive high polymer | |
JPS5466829A (en) | Pattern formation materil | |
JPS5654434A (en) | Radiation and far ultraviolet ray sensitive positive type resist method | |
JPS54116227A (en) | Formation method for positive type resist image | |
JPS56137348A (en) | Negative type ionized radiation sensitive resist | |
JPS5518673A (en) | Ionized radiation sensitive negative type resist | |
JPS5466776A (en) | Fine pattern forming method | |
DE3782833D1 (en) | VACUUM APPLIED PHOTOLACQUES MADE OF ANIONICALLY POLYMERIZABLE MONOMERS. | |
JPS5381116A (en) | Radiation sensitive polymer and its working method | |
JPS561934A (en) | Manufacture of resist image | |
JPS5515149A (en) | Forming method of resist for microfabrication | |
JPS55147624A (en) | Ionized radiation sensitive positive type resist | |
JPS578541A (en) | Positive type resist material | |
JPS5737348A (en) | Electron beam sensitive polymer composition | |
JPS5353314A (en) | Sensitive high polymer composition and picture imae forming method usingsaid composition | |
JPS56114943A (en) | Negative type resist material for electron beam | |
JPS5639536A (en) | Ionizing radiation sensitive resist | |
JPS5558243A (en) | Highly sensitive positive resist composition | |
JPS5669625A (en) | Minute pattern forming method | |
JPS5476136A (en) | Resist material for microprocessing | |
JPS5786832A (en) | Pattern forming material | |
JPS5552051A (en) | Radiation resist and formation method for radiation resist pattern | |
JPS5664336A (en) | Minute pattern forming method |