JPS56118607A - Inspection method for secondary negative - Google Patents
Inspection method for secondary negativeInfo
- Publication number
- JPS56118607A JPS56118607A JP2114880A JP2114880A JPS56118607A JP S56118607 A JPS56118607 A JP S56118607A JP 2114880 A JP2114880 A JP 2114880A JP 2114880 A JP2114880 A JP 2114880A JP S56118607 A JPS56118607 A JP S56118607A
- Authority
- JP
- Japan
- Prior art keywords
- negative
- scan
- line
- picture signals
- reinverted
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Image Analysis (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2114880A JPS56118607A (en) | 1980-02-22 | 1980-02-22 | Inspection method for secondary negative |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2114880A JPS56118607A (en) | 1980-02-22 | 1980-02-22 | Inspection method for secondary negative |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56118607A true JPS56118607A (en) | 1981-09-17 |
Family
ID=12046811
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2114880A Pending JPS56118607A (en) | 1980-02-22 | 1980-02-22 | Inspection method for secondary negative |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56118607A (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59192249A (ja) * | 1983-04-15 | 1984-10-31 | Toppan Printing Co Ltd | 修正画像検査方法及び装置 |
JPS6057842A (ja) * | 1983-09-10 | 1985-04-03 | Somar Corp | 写真製版用フイルム検版装置 |
JPS6380547U (ja) * | 1986-11-14 | 1988-05-27 | ||
JPH05281697A (ja) * | 1992-03-30 | 1993-10-29 | Toppan Printing Co Ltd | フィルム検版装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54113262A (en) * | 1978-02-24 | 1979-09-04 | Hitachi Ltd | Mask inspection unit |
-
1980
- 1980-02-22 JP JP2114880A patent/JPS56118607A/ja active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54113262A (en) * | 1978-02-24 | 1979-09-04 | Hitachi Ltd | Mask inspection unit |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59192249A (ja) * | 1983-04-15 | 1984-10-31 | Toppan Printing Co Ltd | 修正画像検査方法及び装置 |
JPS6057842A (ja) * | 1983-09-10 | 1985-04-03 | Somar Corp | 写真製版用フイルム検版装置 |
JPH048779B2 (ja) * | 1983-09-10 | 1992-02-18 | ||
JPS6380547U (ja) * | 1986-11-14 | 1988-05-27 | ||
JPH05281697A (ja) * | 1992-03-30 | 1993-10-29 | Toppan Printing Co Ltd | フィルム検版装置 |
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