JPS56117107A - Measuring method of profile - Google Patents

Measuring method of profile

Info

Publication number
JPS56117107A
JPS56117107A JP2020680A JP2020680A JPS56117107A JP S56117107 A JPS56117107 A JP S56117107A JP 2020680 A JP2020680 A JP 2020680A JP 2020680 A JP2020680 A JP 2020680A JP S56117107 A JPS56117107 A JP S56117107A
Authority
JP
Japan
Prior art keywords
circumference
beams
section
tangents
noncontact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2020680A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6239681B2 (enrdf_load_stackoverflow
Inventor
Yoshio Kawashima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP2020680A priority Critical patent/JPS56117107A/ja
Publication of JPS56117107A publication Critical patent/JPS56117107A/ja
Publication of JPS6239681B2 publication Critical patent/JPS6239681B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/54—Revolving an optical measuring instrument around a body

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2020680A 1980-02-20 1980-02-20 Measuring method of profile Granted JPS56117107A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2020680A JPS56117107A (en) 1980-02-20 1980-02-20 Measuring method of profile

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020680A JPS56117107A (en) 1980-02-20 1980-02-20 Measuring method of profile

Publications (2)

Publication Number Publication Date
JPS56117107A true JPS56117107A (en) 1981-09-14
JPS6239681B2 JPS6239681B2 (enrdf_load_stackoverflow) 1987-08-25

Family

ID=12020683

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020680A Granted JPS56117107A (en) 1980-02-20 1980-02-20 Measuring method of profile

Country Status (1)

Country Link
JP (1) JPS56117107A (enrdf_load_stackoverflow)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6055210A (ja) * 1983-09-06 1985-03-30 Nec Corp 非接触三次元測定装置
JPS6055212A (ja) * 1983-09-06 1985-03-30 Nec Corp 非接触三次元測定装置
JPS61152908U (enrdf_load_stackoverflow) * 1985-03-13 1986-09-22
FR2620817A1 (fr) * 1987-09-17 1989-03-24 Ngk Insulators Ltd Procede pour mesurer la configuration de contour d'un objet defini par de nombreuses parties de surface cylindriques
JPH0219704A (ja) * 1988-05-16 1990-01-23 Becton Dickinson & Co 管の内径等の測定装置及びその製造方法並びに測定方法
US5408325A (en) * 1991-05-16 1995-04-18 Cruickshank Partners Apparatus for measuring the profile of a moving object
EP1162430A1 (de) * 2000-06-09 2001-12-12 Zumbach Electronic Ag Messvorrichtung für Betonstabstähle
EP1154226A3 (de) * 2000-05-11 2002-05-02 LAP GmbH Laser Applikationen Vorrichtung und Verfahren zur Messung der Dicke und Unrundheit von länglichen Werkstücken
EP1978329A1 (de) * 2007-04-04 2008-10-08 Zumbach Electronic Ag Verfahren zur Rundheitsmessung von Rundprofilen
WO2010037865A1 (de) 2008-10-02 2010-04-08 Zumbach Electronic Ag Verfahren zur bestimmung von formparametern
JP2010169670A (ja) * 2008-12-25 2010-08-05 Shimomura Tokushu Kako Kk 真円度保証器
EP2365280A1 (de) * 2010-03-01 2011-09-14 Zumbach Electronic Ag Verfahren zur optischen Messung von Schienen
CN103383248A (zh) * 2013-07-24 2013-11-06 丽水职业技术学院 一种关节轴承内圈外球面圆球度的检测方法
WO2014184109A1 (en) 2013-05-11 2014-11-20 Zumbach Electronic Ag Method for determining the stamping quality of profiled bar material

Cited By (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6055210A (ja) * 1983-09-06 1985-03-30 Nec Corp 非接触三次元測定装置
JPS6055212A (ja) * 1983-09-06 1985-03-30 Nec Corp 非接触三次元測定装置
JPS61152908U (enrdf_load_stackoverflow) * 1985-03-13 1986-09-22
FR2620817A1 (fr) * 1987-09-17 1989-03-24 Ngk Insulators Ltd Procede pour mesurer la configuration de contour d'un objet defini par de nombreuses parties de surface cylindriques
BE1003159A3 (fr) * 1987-09-17 1991-12-17 Ngk Insulators Ltd Procede de mesure de configurations de contour d'articles.
JPH0219704A (ja) * 1988-05-16 1990-01-23 Becton Dickinson & Co 管の内径等の測定装置及びその製造方法並びに測定方法
US5408325A (en) * 1991-05-16 1995-04-18 Cruickshank Partners Apparatus for measuring the profile of a moving object
DE10023172C5 (de) * 2000-05-11 2007-01-04 Lap Gmbh Laser Applikationen Verfahren und Vorrichtung zur Messung der Unrundheit von länglichen Werkstücken
EP1154226A3 (de) * 2000-05-11 2002-05-02 LAP GmbH Laser Applikationen Vorrichtung und Verfahren zur Messung der Dicke und Unrundheit von länglichen Werkstücken
US6678063B2 (en) 2000-06-09 2004-01-13 Zumbach Electronic Ag Measuring device for reinforcing steel rods for concrete
EP1162430A1 (de) * 2000-06-09 2001-12-12 Zumbach Electronic Ag Messvorrichtung für Betonstabstähle
JP2010523948A (ja) * 2007-04-04 2010-07-15 ツムバッハ エレクトロニク アクチェンゲゼルシャフト 丸線材の真円度を測定する方法
WO2008122385A3 (de) * 2007-04-04 2008-12-11 Zumbach Electronic Ag Verfahren zur rundheitsmessung von rundprofilen
EP1978329A1 (de) * 2007-04-04 2008-10-08 Zumbach Electronic Ag Verfahren zur Rundheitsmessung von Rundprofilen
US8243284B2 (en) 2007-04-04 2012-08-14 Zumbach Electronic Ag Method for measuring the roundness of round profiles
WO2010037865A1 (de) 2008-10-02 2010-04-08 Zumbach Electronic Ag Verfahren zur bestimmung von formparametern
JP2010169670A (ja) * 2008-12-25 2010-08-05 Shimomura Tokushu Kako Kk 真円度保証器
EP2365280A1 (de) * 2010-03-01 2011-09-14 Zumbach Electronic Ag Verfahren zur optischen Messung von Schienen
WO2014184109A1 (en) 2013-05-11 2014-11-20 Zumbach Electronic Ag Method for determining the stamping quality of profiled bar material
CN103383248A (zh) * 2013-07-24 2013-11-06 丽水职业技术学院 一种关节轴承内圈外球面圆球度的检测方法
CN103383248B (zh) * 2013-07-24 2016-09-14 丽水职业技术学院 一种关节轴承内圈外球面圆球度的检测方法

Also Published As

Publication number Publication date
JPS6239681B2 (enrdf_load_stackoverflow) 1987-08-25

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