JPS56107579A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS56107579A JPS56107579A JP906480A JP906480A JPS56107579A JP S56107579 A JPS56107579 A JP S56107579A JP 906480 A JP906480 A JP 906480A JP 906480 A JP906480 A JP 906480A JP S56107579 A JPS56107579 A JP S56107579A
- Authority
- JP
- Japan
- Prior art keywords
- emitter
- base contact
- silicon nitride
- domain
- nitride film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/033—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Bipolar Transistors (AREA)
Abstract
PURPOSE:To obtain a transistor superior in high frequency characteristic to have the interval between emitter and base contact reduced by dividing a selective oxidation process into two times for decision of an element domain and a contact domain. CONSTITUTION:A silicon nitride film is formed selectively on a semiconductor substrate, and the surface is oxidized to form a thick oxide film 1. Next, a P type impurity is injected in a base domain, the silicon nitride film between emitter and base contact is removed to oxidize the surface, thus forming an oxide film 8 thereon. Further, the silicon nitride film 9 on the base contact is removed to diffuse a high density of P type impurity, the base contact 12 is thus formed and also an oxide film is formed. After that, a silicon nitride film 7 on the emitter is removed to diffuse an N type impurity to form an emitter domain 13. A manufacturing tolerance is secured in the interval for the manufacture of emitter and base contact according to the above constitution, therefore a high performance of semiconductor device is obtainable through adjusting the interval.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP906480A JPS56107579A (en) | 1980-01-29 | 1980-01-29 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP906480A JPS56107579A (en) | 1980-01-29 | 1980-01-29 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56107579A true JPS56107579A (en) | 1981-08-26 |
Family
ID=11710176
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP906480A Pending JPS56107579A (en) | 1980-01-29 | 1980-01-29 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56107579A (en) |
-
1980
- 1980-01-29 JP JP906480A patent/JPS56107579A/en active Pending
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