JPS56101791A - Light beam scanning device - Google Patents
Light beam scanning deviceInfo
- Publication number
- JPS56101791A JPS56101791A JP420780A JP420780A JPS56101791A JP S56101791 A JPS56101791 A JP S56101791A JP 420780 A JP420780 A JP 420780A JP 420780 A JP420780 A JP 420780A JP S56101791 A JPS56101791 A JP S56101791A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor laser
- scanning
- scanned surface
- laser
- change
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/10—Scanning systems
- G02B26/12—Scanning systems using multifaceted mirrors
- G02B26/127—Adaptive control of the scanning light beam, e.g. using the feedback from one or more detectors
Abstract
PURPOSE:To detect the passing time of a laser beam scanning on a scanned surface securely, accurately and economically by reflecting a laser beam oscillated from a semiconductor laser with a reflecting mirror disposed on said scanned surface and detecting a returned beam with a detector. CONSTITUTION:A semiconductor laser 21 is excited by a semiconductor exciting circuit 22 and a laser beam 23 is oscillated and outputted. A scanning beam 23b that passed a collimater lens 24, a rotating polyhedron mirror 25 and a condenser lens 26 scans on a scanned surface 27. On the other hand, a reflecting mirror 29 is disposed near a point to start the scanning of said scanned surface and a laser beam reached said reflecting mirror is refleted and returned to said semiconductor laser, then a change in the output of said semiconductor laser or a change in an exciting current is caused by the self coupling effect of said semiconductor laser receiving the returning beam, and by detecting this change with a light detector 30, the passing time of said scanning beam can be found accurately and securely with the low cost device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP420780A JPS56101791A (en) | 1980-01-18 | 1980-01-18 | Light beam scanning device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP420780A JPS56101791A (en) | 1980-01-18 | 1980-01-18 | Light beam scanning device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56101791A true JPS56101791A (en) | 1981-08-14 |
JPS6237825B2 JPS6237825B2 (en) | 1987-08-14 |
Family
ID=11578187
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP420780A Granted JPS56101791A (en) | 1980-01-18 | 1980-01-18 | Light beam scanning device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56101791A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4849980A (en) * | 1986-12-29 | 1989-07-18 | Fuji Photo Film Co., Ltd. | Laser beam recording method and apparatus |
-
1980
- 1980-01-18 JP JP420780A patent/JPS56101791A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4849980A (en) * | 1986-12-29 | 1989-07-18 | Fuji Photo Film Co., Ltd. | Laser beam recording method and apparatus |
Also Published As
Publication number | Publication date |
---|---|
JPS6237825B2 (en) | 1987-08-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS642332A (en) | Method and device for testing desired area of workpiece by designating the area | |
KR880006659A (en) | Optical pickup | |
JPS56101791A (en) | Light beam scanning device | |
DE3751663D1 (en) | Device for detecting the spatial orientation of inadmissibly heated areas | |
JPS5794711A (en) | Optical scanner | |
JPS5783079A (en) | Driving method of semiconductor laser | |
MICHIHARU | Light beam scanning device | |
JPS57167692A (en) | Laser device | |
GB2159362A (en) | Rangefinder | |
JPS5793314A (en) | Semiconductor laser optical device | |
JPS575187A (en) | Recorder | |
JPS57192833A (en) | Method of detecting vibration of object to be measured using coherent light | |
JPS5756704A (en) | Detector for surface flaw of bloom | |
JPS54124780A (en) | Surface inspection apparatus | |
GB1376135A (en) | Detection of blemishes in surfaces | |
JPS5599735A (en) | Testing method for foreign material on wafer | |
JPS6245036B2 (en) | ||
KR950015242A (en) | Optical pickup | |
JPS5497082A (en) | Intensity detector of laser beam | |
JPS6412202A (en) | Semiconductor laser length measuring apparatus | |
JPS5539022A (en) | Optical thickness meter | |
JPS57534A (en) | Radiation thermometer utilizing mirror surface like reflection | |
JPS54109682A (en) | Method of cutting blade inspection | |
JPS6413405A (en) | Surface shape measuring instrument | |
JPS57190246A (en) | Detector for lens defect |