JPS5594144A - Atomic-absorption photometer using zeeman effect - Google Patents

Atomic-absorption photometer using zeeman effect

Info

Publication number
JPS5594144A
JPS5594144A JP69879A JP69879A JPS5594144A JP S5594144 A JPS5594144 A JP S5594144A JP 69879 A JP69879 A JP 69879A JP 69879 A JP69879 A JP 69879A JP S5594144 A JPS5594144 A JP S5594144A
Authority
JP
Japan
Prior art keywords
magnetic field
light
unit
absorbed
atomic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP69879A
Other languages
English (en)
Other versions
JPS596381B2 (ja
Inventor
Konosuke Oishi
Yoji Arai
Shinji Mayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP69879A priority Critical patent/JPS596381B2/ja
Publication of JPS5594144A publication Critical patent/JPS5594144A/ja
Publication of JPS596381B2 publication Critical patent/JPS596381B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/3103—Atomic absorption analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP69879A 1979-01-10 1979-01-10 ゼ−マン効果を用いる原子吸光光度計 Expired JPS596381B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP69879A JPS596381B2 (ja) 1979-01-10 1979-01-10 ゼ−マン効果を用いる原子吸光光度計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP69879A JPS596381B2 (ja) 1979-01-10 1979-01-10 ゼ−マン効果を用いる原子吸光光度計

Publications (2)

Publication Number Publication Date
JPS5594144A true JPS5594144A (en) 1980-07-17
JPS596381B2 JPS596381B2 (ja) 1984-02-10

Family

ID=11480978

Family Applications (1)

Application Number Title Priority Date Filing Date
JP69879A Expired JPS596381B2 (ja) 1979-01-10 1979-01-10 ゼ−マン効果を用いる原子吸光光度計

Country Status (1)

Country Link
JP (1) JPS596381B2 (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4108544A1 (de) * 1990-03-16 1991-09-19 Hitachi Ltd Zeeman-atomabsorptionsspektrophotometer mit neuartiger magneteinrichtung und ihre herstellung
JPH03218424A (ja) * 1989-09-12 1991-09-26 Advantest Corp 分光測定装置
JPH03276315A (ja) * 1990-03-27 1991-12-06 Shimadzu Corp 可動部駆動装置の基準位置決定装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03218424A (ja) * 1989-09-12 1991-09-26 Advantest Corp 分光測定装置
DE4108544A1 (de) * 1990-03-16 1991-09-19 Hitachi Ltd Zeeman-atomabsorptionsspektrophotometer mit neuartiger magneteinrichtung und ihre herstellung
US5106189A (en) * 1990-03-16 1992-04-21 Hitachi, Ltd. Zeeman atomic absorption spectrophotometer
DE4108544C2 (de) * 1990-03-16 1994-05-05 Hitachi Ltd Zeeman-Atomabsorptionsspektrophotometer, Magneteinrichtung dafür sowie Verfahren zur Herstellung der Mittel zum Schutz der Polschuhe und der Magneteinrichtung hierfür
JPH03276315A (ja) * 1990-03-27 1991-12-06 Shimadzu Corp 可動部駆動装置の基準位置決定装置

Also Published As

Publication number Publication date
JPS596381B2 (ja) 1984-02-10

Similar Documents

Publication Publication Date Title
US5081348A (en) Optical polarimeter having four channels
US3183763A (en) Polarization analyzers for optical systems employing polarized light
Martin Polarizing (Martin-Puplett) interferometric spectrometers for the near-and submillimeter spectra
US8379215B2 (en) Rotaryfrog systems and methods
KR100340457B1 (ko) 원형이색성,광학회전및흡수스펙트럼측정방법및이색계
US3741660A (en) Conversion of circular dichroism spectropolarimeter to linear dichroism measurement mode
JPS5594144A (en) Atomic-absorption photometer using zeeman effect
KR100336696B1 (ko) 편광 분석장치 및 편광 분석방법
US4166697A (en) Spectrophotometer employing magneto-optic effect
US3602597A (en) Differential circular dichroism measuring apparatus
US2126410A (en) Spectrophotometer
GB1210273A (en) Optical dichroism measuring apparatus & method
JPS59107273A (ja) 光電流・磁界センサ
JPH02156124A (ja) 光波長分解測定装置
JPS5655811A (en) Sensor
US2999418A (en) Polarimetric apparatus
JPS54128770A (en) Voltmeter
SU789686A1 (ru) Денситометр
JPS6137569B2 (ja)
DE3820226A1 (de) Polarisationssensor
SU1490686A1 (ru) Учебный прибор по физике
SU813133A1 (ru) Устройство дл контрол толщиныКРиСТАлличЕСКиХ плАСТиН ВпРОцЕССЕ дОВОдКи
Neumann The influence of the angle of incidence of light on the diffraction of light by supersonic waves
RU2297622C1 (ru) Интерференционно-поляризационный фильтр для газовой спектроскопии
THURSTON et al. Optical birefringence measurement by means of a rotating analyzer with application to Kerr effect(Rotating analyzer method for rapid measurement of polarized light produced by birefringent materials)