JPS54128770A - Voltmeter - Google Patents
VoltmeterInfo
- Publication number
- JPS54128770A JPS54128770A JP3718478A JP3718478A JPS54128770A JP S54128770 A JPS54128770 A JP S54128770A JP 3718478 A JP3718478 A JP 3718478A JP 3718478 A JP3718478 A JP 3718478A JP S54128770 A JPS54128770 A JP S54128770A
- Authority
- JP
- Japan
- Prior art keywords
- crystal
- voltage
- angle
- electrode
- polarizing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Abstract
PURPOSE: To eliminate the electric noises of a voltage to be metered thereby to improve the metering accuracy by using an electrooptical crystal, which has such a construction that its portion for detecting a high voltage is electrically inconductive.
CONSTITUTION: A projected beam from a light source 3 is converted through a lens 4 into a paralled beam, which is then subjected to linear polarization by means of a polarizing element 5. At this time, the angle between the polarizing plane of the element 5 and the optical axis of an electrooptical crystal 6 is preset at an angle to guide the projected beam into the crystal 6. Since the crystal 6 changes the polarized light component in the preset direction of the beam in accordance with the voltage level to be impressed upon the electrode 7, the intensity of the beam of an optical detecting element 9 is varied with the voltage applied when the beam transmitting through the crystal 6 is observed through the element 9. In the beam having been transmitted with there is no electric field in the crystal 6 is set to become the linear polarized beam having a polarizing plane at a right angle with respect to the element 9, the output of an optical detector 10 is increased with the increase in the voltage applied to the electrode 7 of the crystal 6.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3718478A JPS54128770A (en) | 1978-03-29 | 1978-03-29 | Voltmeter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3718478A JPS54128770A (en) | 1978-03-29 | 1978-03-29 | Voltmeter |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS54128770A true JPS54128770A (en) | 1979-10-05 |
Family
ID=12490492
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3718478A Pending JPS54128770A (en) | 1978-03-29 | 1978-03-29 | Voltmeter |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54128770A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56157872A (en) * | 1980-05-10 | 1981-12-05 | Sumitomo Electric Ind Ltd | Light-applying voltage and electric field sensor |
| US4412173A (en) * | 1981-01-26 | 1983-10-25 | The Oregon Graduate Center For Study And Research | Apparatus using leakage current for measuring resistivity |
| WO2004065972A1 (en) * | 2003-01-20 | 2004-08-05 | Hamamatsu Photonics K.K. | Laser beam inspection equipment |
-
1978
- 1978-03-29 JP JP3718478A patent/JPS54128770A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56157872A (en) * | 1980-05-10 | 1981-12-05 | Sumitomo Electric Ind Ltd | Light-applying voltage and electric field sensor |
| JPH024864B2 (en) * | 1980-05-10 | 1990-01-30 | Sumitomo Electric Industries | |
| US4412173A (en) * | 1981-01-26 | 1983-10-25 | The Oregon Graduate Center For Study And Research | Apparatus using leakage current for measuring resistivity |
| WO2004065972A1 (en) * | 2003-01-20 | 2004-08-05 | Hamamatsu Photonics K.K. | Laser beam inspection equipment |
| JP2004264030A (en) * | 2003-01-20 | 2004-09-24 | Hamamatsu Photonics Kk | Measuring device for beam irradiation heating resistance change |
| US7230436B2 (en) | 2003-01-20 | 2007-06-12 | Hamamatsu Photonics K.K. | Laser beam inspection equipment |
| JP4526765B2 (en) * | 2003-01-20 | 2010-08-18 | 浜松ホトニクス株式会社 | Beam irradiation heating resistance change measuring device |
| KR101031930B1 (en) * | 2003-01-20 | 2011-04-29 | 하마마츠 포토닉스 가부시키가이샤 | Laser beam inspection equipment |
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