JPS5491288A - Method and apparatus for measuring magnetic optical anisotropy - Google Patents

Method and apparatus for measuring magnetic optical anisotropy

Info

Publication number
JPS5491288A
JPS5491288A JP13054778A JP13054778A JPS5491288A JP S5491288 A JPS5491288 A JP S5491288A JP 13054778 A JP13054778 A JP 13054778A JP 13054778 A JP13054778 A JP 13054778A JP S5491288 A JPS5491288 A JP S5491288A
Authority
JP
Japan
Prior art keywords
polarized light
light
elliptically polarized
sample
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13054778A
Other languages
Japanese (ja)
Other versions
JPS5855444B2 (en
Inventor
Manabu Yamamoto
Seiichi Murayama
Sho Ito
Konosuke Oishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP53130547A priority Critical patent/JPS5855444B2/en
Publication of JPS5491288A publication Critical patent/JPS5491288A/en
Publication of JPS5855444B2 publication Critical patent/JPS5855444B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/3103—Atomic absorption analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To achieve easier measurement and higher measurement accuracy by adding a circularly or elliptically polarized light generating means on optical path. CONSTITUTION:An elliptically polarized light generator 2 which combines a linear polarizer 21 and an optical anisotropic element 22 such as 1/4 wavelength plate or the like is disposed on the optical path between a light source 1 and a sample 3. As a result, the light of the light source 1 is changed to elliptically polarized light by the elliptically polarized light generator 2 or is changed of its ellipse rate thereby, after which it enters the sample 3 to which a magnetic field Hs is applied by magnetic poles 4A, 4B. After emerging therefrom, it is separated to mutually orthogonal two polarized light components by a double refractive analyzer 5. These components are detected with photo detectors 7A, 7B. The intensity of the light transmitting through the double refractive analyzer 5 becomes the linear function of the density of the atom number of the sample 3, whereby the measurement is made easier. In addition, even minute changes are also accurately measurably from the magnitude of the light intensity.
JP53130547A 1978-10-25 1978-10-25 Magneto-optical anisotropy measurement method and equipment Expired JPS5855444B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53130547A JPS5855444B2 (en) 1978-10-25 1978-10-25 Magneto-optical anisotropy measurement method and equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53130547A JPS5855444B2 (en) 1978-10-25 1978-10-25 Magneto-optical anisotropy measurement method and equipment

Publications (2)

Publication Number Publication Date
JPS5491288A true JPS5491288A (en) 1979-07-19
JPS5855444B2 JPS5855444B2 (en) 1983-12-09

Family

ID=15036881

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53130547A Expired JPS5855444B2 (en) 1978-10-25 1978-10-25 Magneto-optical anisotropy measurement method and equipment

Country Status (1)

Country Link
JP (1) JPS5855444B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60107546A (en) * 1983-11-15 1985-06-13 Toyo Commun Equip Co Ltd Multi-image element

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60107546A (en) * 1983-11-15 1985-06-13 Toyo Commun Equip Co Ltd Multi-image element

Also Published As

Publication number Publication date
JPS5855444B2 (en) 1983-12-09

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