JPS5749805A - Measuring device for roughness of surface - Google Patents

Measuring device for roughness of surface

Info

Publication number
JPS5749805A
JPS5749805A JP12638080A JP12638080A JPS5749805A JP S5749805 A JPS5749805 A JP S5749805A JP 12638080 A JP12638080 A JP 12638080A JP 12638080 A JP12638080 A JP 12638080A JP S5749805 A JPS5749805 A JP S5749805A
Authority
JP
Japan
Prior art keywords
specimen
image
series
optical image
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12638080A
Other languages
Japanese (ja)
Inventor
Satoshi Furukawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP12638080A priority Critical patent/JPS5749805A/en
Publication of JPS5749805A publication Critical patent/JPS5749805A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To make it possible to measure the roughness of the surface accurately and objectively by providing a line sensor which receives an optical image which is perpendicular to a linear optical image irradiated on a specimen, and transforming the output into a Fourier series. CONSTITUTION:A light emitting part 3 is constituted by a light source 5, a cylindrical lens 6 in front of the source 5, and a slit 7 in front of the lens 6. The linear optical image (i) is irradiated on a specimen M. A sensor part 4 comprises a light receiving lens 8, and a line sensor 9 which is formed in a linear shape, and receives the image (j) which is perpendicular to the image (i) on the specimen M. The output is inputted to a measuring part and transformed into the Fourier series. The more lustrous and smoother the specimen M, the closer the image becomes a rectangular shape, and the high frequency components of series increases. The quality of the surface can be quantitatively obtained from the power spectrum of the series and the result can be objectively displayed.
JP12638080A 1980-09-09 1980-09-09 Measuring device for roughness of surface Pending JPS5749805A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12638080A JPS5749805A (en) 1980-09-09 1980-09-09 Measuring device for roughness of surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12638080A JPS5749805A (en) 1980-09-09 1980-09-09 Measuring device for roughness of surface

Publications (1)

Publication Number Publication Date
JPS5749805A true JPS5749805A (en) 1982-03-24

Family

ID=14933716

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12638080A Pending JPS5749805A (en) 1980-09-09 1980-09-09 Measuring device for roughness of surface

Country Status (1)

Country Link
JP (1) JPS5749805A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5897608A (en) * 1981-12-05 1983-06-10 Nippon Paint Co Ltd Method and device for surface property
WO1986004676A2 (en) * 1985-02-05 1986-08-14 Optische Werke G. Rodenstock Device for optical determination of low-order errors in shape
JPS6249209A (en) * 1985-08-28 1987-03-03 Shimizu Constr Co Ltd Range finder having linear laser light spot oscillator
EP0586795A1 (en) * 1992-09-09 1994-03-16 TZN Forschungs- und Entwicklungszentrum Unterlüss GmbH Procedure and device for the contactless determination of the roughness of surface of objects
JP2007160399A (en) * 2005-11-21 2007-06-28 Daihatsu Motor Co Ltd Method for discriminating rolled material and apparatus for the method
WO2013043103A1 (en) * 2011-09-25 2013-03-28 Lundgren Thim Jan Peter Method for measurement of topography on the surface of a material web

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5897608A (en) * 1981-12-05 1983-06-10 Nippon Paint Co Ltd Method and device for surface property
WO1986004676A2 (en) * 1985-02-05 1986-08-14 Optische Werke G. Rodenstock Device for optical determination of low-order errors in shape
US4763006A (en) * 1985-02-05 1988-08-09 Optische Werke G. Rodenstock Device determining surface element inclination angle for the optical detection of form errors of a low order
JPS6249209A (en) * 1985-08-28 1987-03-03 Shimizu Constr Co Ltd Range finder having linear laser light spot oscillator
EP0586795A1 (en) * 1992-09-09 1994-03-16 TZN Forschungs- und Entwicklungszentrum Unterlüss GmbH Procedure and device for the contactless determination of the roughness of surface of objects
JP2007160399A (en) * 2005-11-21 2007-06-28 Daihatsu Motor Co Ltd Method for discriminating rolled material and apparatus for the method
JP4569967B2 (en) * 2005-11-21 2010-10-27 ダイハツ工業株式会社 Rolled material identification method and apparatus
WO2013043103A1 (en) * 2011-09-25 2013-03-28 Lundgren Thim Jan Peter Method for measurement of topography on the surface of a material web

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