JPS5566725A - Temperature detector - Google Patents

Temperature detector

Info

Publication number
JPS5566725A
JPS5566725A JP8758178A JP8758178A JPS5566725A JP S5566725 A JPS5566725 A JP S5566725A JP 8758178 A JP8758178 A JP 8758178A JP 8758178 A JP8758178 A JP 8758178A JP S5566725 A JPS5566725 A JP S5566725A
Authority
JP
Japan
Prior art keywords
temperature
variation
polarization
light
rectilinear
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8758178A
Other languages
Japanese (ja)
Other versions
JPS6055011B2 (en
Inventor
Katsutoshi Muto
Yoshiharu Komine
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP53087581A priority Critical patent/JPS6055011B2/en
Publication of JPS5566725A publication Critical patent/JPS5566725A/en
Publication of JPS6055011B2 publication Critical patent/JPS6055011B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/58—Radiation pyrometry, e.g. infrared or optical thermometry using absorption; using extinction effect

Abstract

PURPOSE:To enable accurate temperature measurement to be achieved without being influenced by electrical noise, by taking out temperature variation as variation of ligh intensity by utilizing variation of retardation relative to temperature variation of optical crystal equipped with optical anistropy. CONSTITUTION:A light having passed a temperature sensor 5 consisting of optical crystal, due to retardation of temperature of an object of temperature detection, changes to rectilinear polarization, circular polarization, oval polarization and then back to rectilinear polarization with increses of phase difference between normal light and abnormal light if, for instance, the optical crystal is one-axis crystal. And therefore, taken out from an analyzer 6 is a rectilinear polarization whose amplitude is varied according to condition of polarization, that is, light intensity corresponding to variation of temperature of the object of the temperature detection. Thus radiated light is taken into a light detector 9 and convereted into an electrical value corresponding to amplitude of rectilinear polarziation. As temperature variation of the object of temperature detection is taken out as variation of temperature intensity in this manner, temperature measurement (or reading) can be achieved accurately without being influenced by electrical noise.
JP53087581A 1978-07-17 1978-07-17 temperature detection device Expired JPS6055011B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53087581A JPS6055011B2 (en) 1978-07-17 1978-07-17 temperature detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53087581A JPS6055011B2 (en) 1978-07-17 1978-07-17 temperature detection device

Publications (2)

Publication Number Publication Date
JPS5566725A true JPS5566725A (en) 1980-05-20
JPS6055011B2 JPS6055011B2 (en) 1985-12-03

Family

ID=13918959

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53087581A Expired JPS6055011B2 (en) 1978-07-17 1978-07-17 temperature detection device

Country Status (1)

Country Link
JP (1) JPS6055011B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5728339U (en) * 1980-07-23 1982-02-15
JPS57114829A (en) * 1980-12-09 1982-07-16 Fuji Electric Corp Res & Dev Ltd Optical temperature detector
JPS58160827A (en) * 1982-03-19 1983-09-24 Kokusai Denshin Denwa Co Ltd <Kdd> Temperature sensor
JPS61234321A (en) * 1985-04-10 1986-10-18 Hamamatsu Photonics Kk Two-dimensional infrared radiation image detecting device

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5728339U (en) * 1980-07-23 1982-02-15
JPS6135940Y2 (en) * 1980-07-23 1986-10-18
JPS57114829A (en) * 1980-12-09 1982-07-16 Fuji Electric Corp Res & Dev Ltd Optical temperature detector
JPS627484B2 (en) * 1980-12-09 1987-02-17 Fuji Denki Sogo Kenkyusho Kk
JPS58160827A (en) * 1982-03-19 1983-09-24 Kokusai Denshin Denwa Co Ltd <Kdd> Temperature sensor
JPH0440649B2 (en) * 1982-03-19 1992-07-03 Kokusai Denshin Denwa Co Ltd
JPS61234321A (en) * 1985-04-10 1986-10-18 Hamamatsu Photonics Kk Two-dimensional infrared radiation image detecting device
JPH0533331B2 (en) * 1985-04-10 1993-05-19 Hamamatsu Photonics Kk

Also Published As

Publication number Publication date
JPS6055011B2 (en) 1985-12-03

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