JPS5587962A - Device for measuring voltage versus current characteristic - Google Patents

Device for measuring voltage versus current characteristic

Info

Publication number
JPS5587962A
JPS5587962A JP15983978A JP15983978A JPS5587962A JP S5587962 A JPS5587962 A JP S5587962A JP 15983978 A JP15983978 A JP 15983978A JP 15983978 A JP15983978 A JP 15983978A JP S5587962 A JPS5587962 A JP S5587962A
Authority
JP
Japan
Prior art keywords
measured
capacitor
semiconductor
voltage
versus current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15983978A
Other languages
Japanese (ja)
Inventor
Masanori Takakitsu
Minoru Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP15983978A priority Critical patent/JPS5587962A/en
Publication of JPS5587962A publication Critical patent/JPS5587962A/en
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: To accurately and simply measure characteristics in wide applied voltage range by discharging a capacitor charged in advance and applying the voltage across the terminals of the discharging capacitor to an element to be measured.
CONSTITUTION: A resistor 10 and a capacitor 9 connected in parallel with a semiconductor 1 to be measured such as a diode or the like are connected through a switch 11 to a variable DC power supply 2. When the switch 11 is opened, the charged capacitor 9 is discharged through the semiconductor 1 and the resistor 10. At this time the terminal voltage and current of the semiconductor 1 are measured by logarithmic converters 7, 8. Thus, the applied voltage lowering in exponential function can be reproduced in wide range continuously to thus measure accurately the voltage versus current characteristics of the element 1 to be measured.
COPYRIGHT: (C)1980,JPO&Japio
JP15983978A 1978-12-27 1978-12-27 Device for measuring voltage versus current characteristic Pending JPS5587962A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15983978A JPS5587962A (en) 1978-12-27 1978-12-27 Device for measuring voltage versus current characteristic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15983978A JPS5587962A (en) 1978-12-27 1978-12-27 Device for measuring voltage versus current characteristic

Publications (1)

Publication Number Publication Date
JPS5587962A true JPS5587962A (en) 1980-07-03

Family

ID=15702357

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15983978A Pending JPS5587962A (en) 1978-12-27 1978-12-27 Device for measuring voltage versus current characteristic

Country Status (1)

Country Link
JP (1) JPS5587962A (en)

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