JPS5291378A - Semiconductor device measuring method - Google Patents

Semiconductor device measuring method

Info

Publication number
JPS5291378A
JPS5291378A JP771576A JP771576A JPS5291378A JP S5291378 A JPS5291378 A JP S5291378A JP 771576 A JP771576 A JP 771576A JP 771576 A JP771576 A JP 771576A JP S5291378 A JPS5291378 A JP S5291378A
Authority
JP
Japan
Prior art keywords
semiconductor device
measuring method
device measuring
resistor
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP771576A
Other languages
Japanese (ja)
Inventor
Koichi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP771576A priority Critical patent/JPS5291378A/en
Publication of JPS5291378A publication Critical patent/JPS5291378A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To measure the leakage current and the input resistance from the impedance conversion of this equivalent circuit, by connecting the capacitor and oscillator in series between the terminals of the transistor to be measured, and connecting one end of the resistor to the bias terminal or the common terminal and another end to the power supply, and by measuring the voltage across the resistor and the input voltage.
COPYRIGHT: (C)1977,JPO&Japio
JP771576A 1976-01-26 1976-01-26 Semiconductor device measuring method Pending JPS5291378A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP771576A JPS5291378A (en) 1976-01-26 1976-01-26 Semiconductor device measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP771576A JPS5291378A (en) 1976-01-26 1976-01-26 Semiconductor device measuring method

Publications (1)

Publication Number Publication Date
JPS5291378A true JPS5291378A (en) 1977-08-01

Family

ID=11673424

Family Applications (1)

Application Number Title Priority Date Filing Date
JP771576A Pending JPS5291378A (en) 1976-01-26 1976-01-26 Semiconductor device measuring method

Country Status (1)

Country Link
JP (1) JPS5291378A (en)

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