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NEC Corp
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NEC Corp
Nippon Electric Co Ltd
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Application filed by NEC Corp, Nippon Electric Co LtdfiledCriticalNEC Corp
Priority to JP771576ApriorityCriticalpatent/JPS5291378A/en
Publication of JPS5291378ApublicationCriticalpatent/JPS5291378A/en
Testing Of Individual Semiconductor Devices
(AREA)
Abstract
PURPOSE: To measure the leakage current and the input resistance from the impedance conversion of this equivalent circuit, by connecting the capacitor and oscillator in series between the terminals of the transistor to be measured, and connecting one end of the resistor to the bias terminal or the common terminal and another end to the power supply, and by measuring the voltage across the resistor and the input voltage.