JPS5587392A - Semiconductor memory device - Google Patents

Semiconductor memory device

Info

Publication number
JPS5587392A
JPS5587392A JP15750078A JP15750078A JPS5587392A JP S5587392 A JPS5587392 A JP S5587392A JP 15750078 A JP15750078 A JP 15750078A JP 15750078 A JP15750078 A JP 15750078A JP S5587392 A JPS5587392 A JP S5587392A
Authority
JP
Japan
Prior art keywords
signals
address strobe
given
signal
semiconductor memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15750078A
Other languages
Japanese (ja)
Other versions
JPS59920B2 (en
Inventor
Ryoichi Kurihara
Kazuya Hashimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP53157500A priority Critical patent/JPS59920B2/en
Publication of JPS5587392A publication Critical patent/JPS5587392A/en
Publication of JPS59920B2 publication Critical patent/JPS59920B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Debugging And Monitoring (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

PURPOSE: To realize the parity check with no use of the test signal but by using even units of the row address strobe signal and the column address strobe signal each in each action mode.
CONSTITUTION: Memory element columns 3W6 with the semiconductor memory elements provided in an optional number are distributed in the data axis direction. When the data is read out or written, signals 11 and 12 given from timing generator circuit 1 are decoded 2 based on the column selection address signal. Then obtained row address strobe signals 15W18 plus column address strobe signals 19W22 are supplied to element rows 3W6 one piece of which is selected each. While at the refreshing time, only signals 15W18 are transmitted simultaneously to all memory elements provided to the address direction in the even number. And the test is given through parity check circuit 7 to the signals of even units which are transmitted simultaneously, thus the decision being given to the malfunction.
COPYRIGHT: (C)1980,JPO&Japio
JP53157500A 1978-12-22 1978-12-22 semiconductor storage device Expired JPS59920B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53157500A JPS59920B2 (en) 1978-12-22 1978-12-22 semiconductor storage device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53157500A JPS59920B2 (en) 1978-12-22 1978-12-22 semiconductor storage device

Publications (2)

Publication Number Publication Date
JPS5587392A true JPS5587392A (en) 1980-07-02
JPS59920B2 JPS59920B2 (en) 1984-01-09

Family

ID=15651035

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53157500A Expired JPS59920B2 (en) 1978-12-22 1978-12-22 semiconductor storage device

Country Status (1)

Country Link
JP (1) JPS59920B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS581897A (en) * 1981-06-25 1983-01-07 Fujitsu Ltd Detecting system for faulty area of memory device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS581897A (en) * 1981-06-25 1983-01-07 Fujitsu Ltd Detecting system for faulty area of memory device
JPS6046458B2 (en) * 1981-06-25 1985-10-16 富士通株式会社 Memory device fault detection method

Also Published As

Publication number Publication date
JPS59920B2 (en) 1984-01-09

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