JPS5587392A - Semiconductor memory device - Google Patents
Semiconductor memory deviceInfo
- Publication number
- JPS5587392A JPS5587392A JP15750078A JP15750078A JPS5587392A JP S5587392 A JPS5587392 A JP S5587392A JP 15750078 A JP15750078 A JP 15750078A JP 15750078 A JP15750078 A JP 15750078A JP S5587392 A JPS5587392 A JP S5587392A
- Authority
- JP
- Japan
- Prior art keywords
- signals
- address strobe
- given
- signal
- semiconductor memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
- Debugging And Monitoring (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Abstract
PURPOSE: To realize the parity check with no use of the test signal but by using even units of the row address strobe signal and the column address strobe signal each in each action mode.
CONSTITUTION: Memory element columns 3W6 with the semiconductor memory elements provided in an optional number are distributed in the data axis direction. When the data is read out or written, signals 11 and 12 given from timing generator circuit 1 are decoded 2 based on the column selection address signal. Then obtained row address strobe signals 15W18 plus column address strobe signals 19W22 are supplied to element rows 3W6 one piece of which is selected each. While at the refreshing time, only signals 15W18 are transmitted simultaneously to all memory elements provided to the address direction in the even number. And the test is given through parity check circuit 7 to the signals of even units which are transmitted simultaneously, thus the decision being given to the malfunction.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP53157500A JPS59920B2 (en) | 1978-12-22 | 1978-12-22 | semiconductor storage device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP53157500A JPS59920B2 (en) | 1978-12-22 | 1978-12-22 | semiconductor storage device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5587392A true JPS5587392A (en) | 1980-07-02 |
JPS59920B2 JPS59920B2 (en) | 1984-01-09 |
Family
ID=15651035
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53157500A Expired JPS59920B2 (en) | 1978-12-22 | 1978-12-22 | semiconductor storage device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59920B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS581897A (en) * | 1981-06-25 | 1983-01-07 | Fujitsu Ltd | Detecting system for faulty area of memory device |
-
1978
- 1978-12-22 JP JP53157500A patent/JPS59920B2/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS581897A (en) * | 1981-06-25 | 1983-01-07 | Fujitsu Ltd | Detecting system for faulty area of memory device |
JPS6046458B2 (en) * | 1981-06-25 | 1985-10-16 | 富士通株式会社 | Memory device fault detection method |
Also Published As
Publication number | Publication date |
---|---|
JPS59920B2 (en) | 1984-01-09 |
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