JPS5587283A - Recognizing method and servo unit with recognizing function - Google Patents

Recognizing method and servo unit with recognizing function

Info

Publication number
JPS5587283A
JPS5587283A JP16046478A JP16046478A JPS5587283A JP S5587283 A JPS5587283 A JP S5587283A JP 16046478 A JP16046478 A JP 16046478A JP 16046478 A JP16046478 A JP 16046478A JP S5587283 A JPS5587283 A JP S5587283A
Authority
JP
Japan
Prior art keywords
information
semiconductor memory
unit
photographing
magnetic tape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16046478A
Other languages
English (en)
Other versions
JPS6016673B2 (ja
Inventor
Ichiro Masaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kawasaki Heavy Industries Ltd
Original Assignee
Kawasaki Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Heavy Industries Ltd filed Critical Kawasaki Heavy Industries Ltd
Priority to JP53160464A priority Critical patent/JPS6016673B2/ja
Priority to DE19792952443 priority patent/DE2952443A1/de
Publication of JPS5587283A publication Critical patent/JPS5587283A/ja
Priority to US06/239,621 priority patent/US4547800A/en
Publication of JPS6016673B2 publication Critical patent/JPS6016673B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Image Analysis (AREA)
  • Processing Or Creating Images (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Image Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP53160464A 1978-12-25 1978-12-25 サ−ボ系における被検体認識装置 Expired JPS6016673B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP53160464A JPS6016673B2 (ja) 1978-12-25 1978-12-25 サ−ボ系における被検体認識装置
DE19792952443 DE2952443A1 (de) 1978-12-25 1979-12-27 Verfahren und vorrichtung zum ermitteln der lage eines gegenstandes
US06/239,621 US4547800A (en) 1978-12-25 1981-03-02 Position detecting method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53160464A JPS6016673B2 (ja) 1978-12-25 1978-12-25 サ−ボ系における被検体認識装置

Publications (2)

Publication Number Publication Date
JPS5587283A true JPS5587283A (en) 1980-07-01
JPS6016673B2 JPS6016673B2 (ja) 1985-04-26

Family

ID=15715499

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53160464A Expired JPS6016673B2 (ja) 1978-12-25 1978-12-25 サ−ボ系における被検体認識装置

Country Status (3)

Country Link
US (1) US4547800A (ja)
JP (1) JPS6016673B2 (ja)
DE (1) DE2952443A1 (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58103323A (ja) * 1981-12-03 1983-06-20 ヘキスト・アクチエンゲゼルシヤフト インシュリン含有混合物の分離法
JPS59100804A (ja) * 1982-12-02 1984-06-11 Nippon Tsushin Gijutsu Kk 平面光切断法を用いたロボツト用計測ヘツド
JPS61152382A (ja) * 1984-12-27 1986-07-11 三井造船株式会社 溶接ロボツトの制御方法
JPS624588A (ja) * 1985-06-28 1987-01-10 オムロン株式会社 重心および主軸角検出装置
JPS63230276A (ja) * 1987-03-17 1988-09-26 インダストリアル・テクノロジ−・リサ−チ・インステイテユ−ト 溶接ロボツトの人工視覚による溶接継ぎ目の追跡方法及び装置

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JPS5887603A (ja) * 1981-11-20 1983-05-25 Tokico Ltd 産業用ロボツト
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FR2570913B1 (fr) * 1984-09-24 1988-06-10 Aerospatiale Procede et dispositif d'aide au positionnement de pieces par superposition d'images
US4697245A (en) * 1984-11-29 1987-09-29 Cbit Corporation Inspection and measuring apparatus and method
DE3613229A1 (de) * 1985-04-20 1986-10-23 Fuji Photo Film Co., Ltd., Minami-Ashigara, Kanagawa Verfahren zum erfassen und verarbeiten von bildinformation
EP0273032B1 (de) * 1985-08-14 1990-06-13 Fraunhofer-Gesellschaft Zur Förderung Der Angewandten Forschung E.V. Verfahren zur ermittlung einer geometrischen kenngrösse für gekräuselte, irregulär strukturierte fasern
US4727471A (en) * 1985-08-29 1988-02-23 The Board Of Governors For Higher Education, State Of Rhode Island And Providence Miniature lightweight digital camera for robotic vision system applications
US4706120A (en) * 1985-08-30 1987-11-10 Texas Instruments Incorporated Modular, vision system for automation of inspection and process control
US5163101A (en) * 1985-10-07 1992-11-10 Schlumberger Technologies, Inc. Bitplane area correlator
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US4694181A (en) * 1986-07-07 1987-09-15 Piller Richard G Web lateral position control system using both coarse and fine mode control means
US4987604A (en) * 1989-06-02 1991-01-22 Delco Electronics Corporation Second opinion method of pattern recognition error reduction
US4987357A (en) * 1989-12-18 1991-01-22 General Motors Corporation Adaptive motor vehicle cruise control
US5208763A (en) * 1990-09-14 1993-05-04 New York University Method and apparatus for determining position and orientation of mechanical objects
US5083073A (en) * 1990-09-20 1992-01-21 Mazada Motor Manufacturing U.S.A. Corp. Method and apparatus for calibrating a vision guided robot
US5295200A (en) * 1991-01-09 1994-03-15 Board Of Regents, The University Of Texas System Method and apparatus for determining the alignment of an object
JP2764485B2 (ja) * 1991-08-27 1998-06-11 ファナック株式会社 リアルタイムセンサの診断方法
US5257325A (en) * 1991-12-11 1993-10-26 International Business Machines Corporation Electronic parallel raster dual image registration device
EP0578432A3 (en) * 1992-07-06 1994-06-22 Canon Kk Similarity determination among patterns using affine-invariant features
WO1994020925A1 (en) * 1993-03-01 1994-09-15 United Parcel Service Of America, Inc. Method and apparatus for locating a two-dimensional symbol using a double template
US5475768A (en) * 1993-04-29 1995-12-12 Canon Inc. High accuracy optical character recognition using neural networks with centroid dithering
US5539840A (en) * 1993-10-19 1996-07-23 Canon Inc. Multifont optical character recognition using a box connectivity approach
US5495537A (en) * 1994-06-01 1996-02-27 Cognex Corporation Methods and apparatus for machine vision template matching of images predominantly having generally diagonal and elongate features
US5793901A (en) * 1994-09-30 1998-08-11 Omron Corporation Device and method to detect dislocation of object image data
JPH08123536A (ja) * 1994-10-25 1996-05-17 Fanuc Ltd 溶接トーチ姿勢の教示方法
US5694482A (en) * 1994-11-08 1997-12-02 Universal Instruments Corporation System and method for locating solder bumps on semiconductor chips or chip carriers
US5752266A (en) * 1995-03-13 1998-05-12 Fujitsu Limited Method controlling memory access operations by changing respective priorities thereof, based on a situation of the memory, and a system and an integrated circuit implementing the method
JP3434979B2 (ja) * 1996-07-23 2003-08-11 富士通株式会社 局所領域画像追跡装置
US6888958B1 (en) * 1999-03-30 2005-05-03 Kabushiki Kaisha Toshiba Method and apparatus for inspecting patterns
US6591160B2 (en) * 2000-12-04 2003-07-08 Asyst Technologies, Inc. Self teaching robot
JP3806342B2 (ja) * 2001-11-26 2006-08-09 三菱重工業株式会社 ３次元形状物溶接方法及びその装置
US20070171981A1 (en) * 2006-01-25 2007-07-26 Yingyong Qi Projection based techniques and apparatus that generate motion vectors used for video stabilization and encoding
US7734084B2 (en) * 2006-10-20 2010-06-08 Hewlett-Packard Development Company, L.P. Method and system for offset estimation and alignment
DE602008000416D1 (de) * 2008-02-13 2010-01-28 Abb As System und Verfahren zur Visualisierung von Verfahrensfehlern
JP2011141809A (ja) * 2010-01-08 2011-07-21 Sumitomo Electric Ind Ltd 画像データ分析装置及び画像データ分析方法
JP6312991B2 (ja) * 2013-06-25 2018-04-18 株式会社東芝 画像出力装置
EP3433573B1 (de) * 2016-03-22 2020-06-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur 3-dimensionalen vermessung eines objekts, verfahren und computerprogramm
US11311958B1 (en) * 2019-05-13 2022-04-26 Airgas, Inc. Digital welding and cutting efficiency analysis, process evaluation and response feedback system for process optimization
JP7555043B2 (ja) * 2020-03-05 2024-09-24 パナソニックＩｐマネジメント株式会社 ビード外観検査装置、ビード外観検査方法、プログラムおよびビード外観検査システム
CN112050944B (zh) * 2020-08-31 2023-12-08 深圳数联天下智能科技有限公司 门口位置确定方法及相关装置
CN113241502B (zh) * 2021-04-13 2022-12-27 珠海冠宇电池股份有限公司 一种虚焊检测方法、虚焊检测装置及锂电池的制备方法

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GB1234941A (en) * 1967-08-16 1971-06-09 Emi Ltd Improvements in or relating to pattern recognition devices
US3532807A (en) * 1967-10-05 1970-10-06 Webb James E Automatic closed circuit television arc guidance control
FR2044025A5 (ja) * 1969-05-06 1971-02-19 Thomson Csf
US3618742A (en) * 1970-05-18 1971-11-09 Stanley J Blanchard Automatic object adjustment
US3717848A (en) * 1970-06-02 1973-02-20 Recognition Equipment Inc Stored reference code character reader method and system
US3845466A (en) * 1970-11-18 1974-10-29 California Inst Of Techn System and method for character recognition
US3955072A (en) * 1971-03-22 1976-05-04 Kasper Instruments, Inc. Apparatus for the automatic alignment of two superimposed objects for example a semiconductor wafer and a transparent mask
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US3766355A (en) * 1971-08-23 1973-10-16 E Kottkamp Apparatus for use with electron beam welding machines
BE789353A (fr) * 1971-09-27 1973-03-27 Siemens Ag Procede et dispositif pour l'identification automatique de caracteres d'ecriture a l'aide d'une matrice de classification invariante en translation
BE791992A (fr) * 1971-11-30 1973-03-16 Licentia Gmbh Procede de centrage d'un caractere introduit dans le dispositifd'identification d'un appareil de reconnaissance de caracteres et montage permettant la mise en oeuvre de ce procede
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JPS5923467B2 (ja) * 1979-04-16 1984-06-02 株式会社日立製作所 位置検出方法
DE2929846A1 (de) * 1979-07-23 1981-03-12 Siemens AG, 1000 Berlin und 8000 München Opto-elektronisches pruefsystem zur automatischen beschaffenheitspruefung von leiterplatten, deren zwischenprodukte und druckwerkzeuge

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58103323A (ja) * 1981-12-03 1983-06-20 ヘキスト・アクチエンゲゼルシヤフト インシュリン含有混合物の分離法
JPH0354678B2 (ja) * 1981-12-03 1991-08-20
JPS59100804A (ja) * 1982-12-02 1984-06-11 Nippon Tsushin Gijutsu Kk 平面光切断法を用いたロボツト用計測ヘツド
JPS61152382A (ja) * 1984-12-27 1986-07-11 三井造船株式会社 溶接ロボツトの制御方法
JPS624588A (ja) * 1985-06-28 1987-01-10 オムロン株式会社 重心および主軸角検出装置
JPS63230276A (ja) * 1987-03-17 1988-09-26 インダストリアル・テクノロジ−・リサ−チ・インステイテユ−ト 溶接ロボツトの人工視覚による溶接継ぎ目の追跡方法及び装置

Also Published As

Publication number Publication date
DE2952443A1 (de) 1980-07-03
JPS6016673B2 (ja) 1985-04-26
US4547800A (en) 1985-10-15

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