JPS5585264A - Function test evaluation device for integrated circuit - Google Patents
Function test evaluation device for integrated circuitInfo
- Publication number
- JPS5585264A JPS5585264A JP16070578A JP16070578A JPS5585264A JP S5585264 A JPS5585264 A JP S5585264A JP 16070578 A JP16070578 A JP 16070578A JP 16070578 A JP16070578 A JP 16070578A JP S5585264 A JPS5585264 A JP S5585264A
- Authority
- JP
- Japan
- Prior art keywords
- information
- integrated circuit
- tested
- time
- function test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31935—Storing data, e.g. failure memory
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16070578A JPS5585264A (en) | 1978-12-23 | 1978-12-23 | Function test evaluation device for integrated circuit |
US06/098,694 US4312067A (en) | 1978-12-23 | 1979-11-29 | Function test evaluation apparatus for evaluating a function test of a logic circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16070578A JPS5585264A (en) | 1978-12-23 | 1978-12-23 | Function test evaluation device for integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5585264A true JPS5585264A (en) | 1980-06-27 |
Family
ID=15720675
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16070578A Pending JPS5585264A (en) | 1978-12-23 | 1978-12-23 | Function test evaluation device for integrated circuit |
Country Status (2)
Country | Link |
---|---|
US (1) | US4312067A (ja) |
JP (1) | JPS5585264A (ja) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5693189A (en) | 1979-12-18 | 1981-07-28 | Fujitsu Ltd | Field programable element |
CA1163721A (en) * | 1980-08-18 | 1984-03-13 | Milan Slamka | Apparatus for the dynamic in-circuit testing of electronic digital circuit elements |
US4433412A (en) * | 1981-05-15 | 1984-02-21 | Rockwell International Corporation | Method and apparatus for testing and verifying the operability of register based state machine apparatus |
US4502127A (en) * | 1982-05-17 | 1985-02-26 | Fairchild Camera And Instrument Corporation | Test system memory architecture for passing parameters and testing dynamic components |
FR2531230A1 (fr) * | 1982-07-27 | 1984-02-03 | Rank Xerox Sa | Ensemble destine au test automatique centralise de circuits imprimes et procede de test de circuits a microprocesseur faisant application de cet ensemble |
US4527272A (en) * | 1982-12-06 | 1985-07-02 | Tektronix, Inc. | Signature analysis using random probing and signature memory |
US4617663A (en) * | 1983-04-13 | 1986-10-14 | At&T Information Systems Inc. | Interface testing of software systems |
US4639919A (en) * | 1983-12-19 | 1987-01-27 | International Business Machines Corporation | Distributed pattern generator |
JPH0743413B2 (ja) * | 1984-05-09 | 1995-05-15 | 三菱電機株式会社 | 半導体試験装置 |
US4625313A (en) * | 1984-07-06 | 1986-11-25 | Tektronix, Inc. | Method and apparatus for testing electronic equipment |
US5113412A (en) * | 1990-06-08 | 1992-05-12 | General Datacomm, Inc. | Method and apparatus for mapping an eight dimensional constellation of a convolutionally coded communication system |
US6242269B1 (en) * | 1997-11-03 | 2001-06-05 | Texas Instruments Incorporated | Parallel scan distributors and collectors and process of testing integrated circuits |
CN1459027A (zh) * | 2001-03-13 | 2003-11-26 | 皇家菲利浦电子有限公司 | 具有改进的可靠性的集成电路测试装置 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3714571A (en) * | 1970-03-04 | 1973-01-30 | Digital General Corp | Apparatus and method for testing electrical systems having pulse signal responses |
US3673397A (en) * | 1970-10-02 | 1972-06-27 | Singer Co | Circuit tester |
US3761695A (en) * | 1972-10-16 | 1973-09-25 | Ibm | Method of level sensitive testing a functional logic system |
US4194113A (en) * | 1978-04-13 | 1980-03-18 | Ncr Corporation | Method and apparatus for isolating faults in a logic circuit |
-
1978
- 1978-12-23 JP JP16070578A patent/JPS5585264A/ja active Pending
-
1979
- 1979-11-29 US US06/098,694 patent/US4312067A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US4312067A (en) | 1982-01-19 |
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